SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

OLIVO, Piero
 Distribuzione geografica
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Continente #
NA - Nord America 16.601
AS - Asia 6.611
EU - Europa 5.987
SA - Sud America 1.151
AF - Africa 125
Continente sconosciuto - Info sul continente non disponibili 8
OC - Oceania 3
AN - Antartide 1
Totale 30.487
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Nazione #
US - Stati Uniti d'America 16.165
SG - Singapore 2.626
PL - Polonia 2.055
CN - Cina 2.040
BR - Brasile 1.001
IT - Italia 888
UA - Ucraina 791
HK - Hong Kong 741
DE - Germania 661
GB - Regno Unito 602
TR - Turchia 466
VN - Vietnam 288
CA - Canada 261
SE - Svezia 234
FI - Finlandia 230
RU - Federazione Russa 193
MX - Messico 139
ID - Indonesia 80
FR - Francia 77
NL - Olanda 77
IN - India 75
AR - Argentina 63
ZA - Sudafrica 63
ES - Italia 46
JP - Giappone 43
BD - Bangladesh 41
KR - Corea 40
AT - Austria 35
BE - Belgio 29
TW - Taiwan 29
IQ - Iraq 25
MA - Marocco 19
PY - Paraguay 19
EC - Ecuador 17
VE - Venezuela 17
CO - Colombia 15
PK - Pakistan 15
IL - Israele 13
LT - Lituania 13
UZ - Uzbekistan 13
CZ - Repubblica Ceca 12
AE - Emirati Arabi Uniti 11
JO - Giordania 11
NP - Nepal 10
TN - Tunisia 10
CH - Svizzera 8
KE - Kenya 8
IE - Irlanda 7
CL - Cile 6
DO - Repubblica Dominicana 6
DZ - Algeria 6
EG - Egitto 6
EU - Europa 6
SA - Arabia Saudita 6
SN - Senegal 6
AZ - Azerbaigian 5
BO - Bolivia 5
GR - Grecia 5
GT - Guatemala 5
HN - Honduras 5
LB - Libano 5
PE - Perù 5
CR - Costa Rica 4
JM - Giamaica 4
KZ - Kazakistan 4
AU - Australia 3
KG - Kirghizistan 3
PA - Panama 3
PT - Portogallo 3
RO - Romania 3
TT - Trinidad e Tobago 3
AL - Albania 2
AM - Armenia 2
AO - Angola 2
BA - Bosnia-Erzegovina 2
BB - Barbados 2
BG - Bulgaria 2
ET - Etiopia 2
GD - Grenada 2
HU - Ungheria 2
IR - Iran 2
KW - Kuwait 2
LV - Lettonia 2
MK - Macedonia 2
NO - Norvegia 2
PS - Palestinian Territory 2
SK - Slovacchia (Repubblica Slovacca) 2
SY - Repubblica araba siriana 2
UY - Uruguay 2
XK - ???statistics.table.value.countryCode.XK??? 2
AQ - Antartide 1
BH - Bahrain 1
BN - Brunei Darussalam 1
CI - Costa d'Avorio 1
CY - Cipro 1
EE - Estonia 1
GE - Georgia 1
GY - Guiana 1
KY - Cayman, isole 1
LA - Repubblica Popolare Democratica del Laos 1
Totale 30.477
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Città #
Fairfield 2.174
Warsaw 2.047
Woodbridge 1.738
Singapore 1.518
Ashburn 1.333
Houston 1.295
Seattle 897
Jacksonville 852
Ann Arbor 774
Santa Clara 771
Wilmington 762
Cambridge 735
Hong Kong 735
Beijing 642
Chandler 622
Izmir 317
Ferrara 305
Nanjing 280
Princeton 196
Milan 195
Addison 190
San Diego 180
Los Angeles 169
Munich 135
Dallas 130
Ho Chi Minh City 123
Boardman 122
The Dalles 118
Mcallen 113
Montréal 108
Mexico City 105
London 102
New York 97
Shanghai 96
São Paulo 92
Nanchang 81
Shenyang 79
Chicago 76
Ottawa 75
Helsinki 65
Hanoi 63
Jakarta 63
Changsha 62
Dearborn 59
Tianjin 57
Jiaxing 53
Council Bluffs 52
Hefei 51
Hebei 50
Moscow 49
Settimo Milanese 44
Brooklyn 41
San Mateo 39
Amsterdam 38
Redwood City 38
Tokyo 37
Falls Church 36
Phoenix 35
Orem 34
Rio de Janeiro 34
Johannesburg 33
Montreal 33
Stockholm 33
Denver 32
Jinan 32
Norwalk 32
Atlanta 30
Boston 28
Chennai 28
Hangzhou 28
Vienna 28
Auburn Hills 27
Poplar 27
San Francisco 27
Columbus 26
Des Moines 26
Mountain View 26
Brussels 25
Falkenstein 25
Belo Horizonte 21
Frankfurt An Der Oder 21
Frankfurt am Main 21
Manchester 21
Napoli 21
Bologna 20
Brasília 20
Guangzhou 20
Toronto 20
Ningbo 19
Zhengzhou 19
Dong Ket 17
Kunming 17
Philadelphia 16
The Hague 16
Orange 15
Taipei 15
Turku 15
Verona 15
Curitiba 14
Nuremberg 13
Totale 22.301
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Nome #
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 479
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 477
RRAM Reliability/Performance Characterization through Array Architectures Investigations 434
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 381
Automated characterization of TAS-MRAM test arrays 378
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 377
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 371
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 360
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 349
Radiation hard design of HfO2 based 1T1R cells and memory arrays 348
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 336
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 335
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 252
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 252
Simulations of the software-defined flash 224
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 211
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 211
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 210
Reliability challenges in 3D NAND Flash memories 203
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 202
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 200
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 196
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 195
Fundamental variability limits of filament-based RRAM 191
Constant charge erasing scheme for Flash Memories 188
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 185
Analysis of reliability/performance trade-off in Solid State Drives 184
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 183
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 183
A Probabilistic Fault Model for “Analog” Faults in Digital CMOS Circuits 183
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 182
Architectural and Integration Options for 3D NAND Flash Memories 182
Erratic bits in flash memories under Fowler-Nordheim programming 180
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 180
Dielectric reliability for future logic and Non-Volatile Memory applications: a statistical simulation analysis approach 180
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 179
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 178
Overerase Phenomena: An Insight into Flash memory Reliability 177
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 176
Statistical Methodologies for Integrated Circuits Design 175
A BIST Scheme for Non-Volatile Memories 175
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 173
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 173
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 173
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 172
Impact of Pulsed Operation on Performance and Reliability of Flash Memories 171
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 171
A new failure mode of very thin (< 50 A) Thermal SiO2 Films 171
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 171
Aliasing in Signature Analysis Testing with Multiple-Input Shift-Registers 169
An automated test equipment for characterization of emerging MRAM and RRAM arrays 169
Erratic bits in Flash memories under Fowler-Nordheim programming 166
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 166
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 166
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 166
An Analytical Model for the Aliasing Probability in Signature Analysis Testing 165
Bit error rate analysis in Charge Trapping memories for SSD applications 165
A New Analytical Model of the Erasing Operation in Phase Change Memories 165
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 165
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 165
Characterization of flash structures erased with ultra-short pulses 164
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 164
Reliability of 3D NAND Flash Memories 164
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 163
Advanced Electrical-Level Modeling of EEPROM Cells 162
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 162
Simulation of SSD’s power consumption 161
Hot Electrons in MOS Transistors: Lateral Distribution of the Trapped Oxide Charge 160
Correlated Fluctuations and Noise Spectra of Tunneling and Substrate Currents Before Breakdown in Thin-Oxide MOS Devices 160
Quantum Effects in Accumulation Layers of Si-SiO2 Interfaces in the WKB Effective Mass Approximation 159
Reliability and performance characterization of a mems-based non-volatile switch 159
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 159
Automated Test Equipment for research on Non volatile memories 158
Dynamics of Fast-Erasing Bits in Flash Memories 157
Electron trapping/detrapping within thin SiO2 films in the high field tunneling regime 156
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 156
Analysis of Erratic Bits in FLASH Memories 156
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 156
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 156
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 155
Analysis of Erratic Bits in Flash Memories 155
Resistive RAM technology for SSDs 155
A Novel Critical Path Heuristic for Fast Fault Grading 153
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 150
SSDExplorer: A virtual platform for SSD simulations 150
Reliability of erasing operation in NOR-Flash memories 149
Simulations of RRAM-based SSDs 149
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 148
Quantum effects in accumulated MOS thin dielectric structures 147
Memory driven design methodologies for optimal SSD performance 147
Two-Dimensional Effects in Hot-Electron Modified MOSFET's 146
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 146
Low-Frequency Noise in Silicon-Gate Metal-Oxide-Silicon Capacitors Before Oxide Breakdown 145
Testing of E2PROM Aging and Endurance: a Case Study 145
Fault Simulation for General FCMOS ICs 145
Reliability Evaluation of Combinational Logic Circuits by Symbolic Simulation 145
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 145
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 145
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 144
Evidence of the Role of Defects Near the Injecting Interface in Determining SiO2 Breakdown 144
Totale 19.584
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Categoria #
all - tutte 135.189
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 10.825
Totale 146.014
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20212.148 0 0 0 0 0 458 201 388 103 539 279 180
2021/20222.125 106 146 157 44 169 126 126 107 116 166 199 663
2022/20231.755 207 17 82 183 230 289 174 167 213 10 139 44
2023/2024721 105 108 21 28 50 38 27 51 17 24 10 242
2024/20254.159 92 181 356 55 451 503 181 316 487 574 653 310
2025/20266.089 924 546 989 1.471 1.773 386 0 0 0 0 0 0
Totale 30.813