SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

OLIVO, Piero
 Distribuzione geografica
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Continente #
NA - Nord America 18.236
AS - Asia 8.772
EU - Europa 6.354
SA - Sud America 1.407
AF - Africa 216
Continente sconosciuto - Info sul continente non disponibili 9
OC - Oceania 3
AN - Antartide 1
Totale 34.998
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Nazione #
US - Stati Uniti d'America 17.743
SG - Singapore 3.287
CN - Cina 2.339
PL - Polonia 2.059
BR - Brasile 1.134
IT - Italia 916
VN - Vietnam 875
HK - Hong Kong 822
UA - Ucraina 799
DE - Germania 686
GB - Regno Unito 630
TR - Turchia 508
CA - Canada 278
FR - Francia 266
FI - Finlandia 254
SE - Svezia 236
JP - Giappone 205
RU - Federazione Russa 205
MX - Messico 156
IN - India 144
ID - Indonesia 100
AR - Argentina 97
NL - Olanda 93
BD - Bangladesh 90
ZA - Sudafrica 89
IQ - Iraq 55
ES - Italia 54
KR - Corea 47
PK - Pakistan 44
EC - Ecuador 40
CO - Colombia 39
AT - Austria 38
VE - Venezuela 36
TW - Taiwan 35
MA - Marocco 31
BE - Belgio 29
UZ - Uzbekistan 26
PH - Filippine 22
PY - Paraguay 22
MY - Malesia 21
SA - Arabia Saudita 19
TN - Tunisia 19
JO - Giordania 18
CL - Cile 17
KE - Kenya 16
NP - Nepal 16
AE - Emirati Arabi Uniti 15
CZ - Repubblica Ceca 13
IL - Israele 13
LT - Lituania 13
AZ - Azerbaigian 11
CR - Costa Rica 11
DZ - Algeria 11
EG - Egitto 11
BO - Bolivia 10
DO - Repubblica Dominicana 10
IE - Irlanda 10
SN - Senegal 10
KZ - Kazakistan 9
LB - Libano 9
PE - Perù 9
CH - Svizzera 8
ET - Etiopia 8
JM - Giamaica 7
EU - Europa 6
GR - Grecia 6
OM - Oman 6
AL - Albania 5
AO - Angola 5
GT - Guatemala 5
HN - Honduras 5
NI - Nicaragua 5
PA - Panama 5
PS - Palestinian Territory 5
SY - Repubblica araba siriana 5
GD - Grenada 4
HU - Ungheria 4
KG - Kirghizistan 4
PT - Portogallo 4
RO - Romania 4
TH - Thailandia 4
AM - Armenia 3
AU - Australia 3
BA - Bosnia-Erzegovina 3
GE - Georgia 3
LV - Lettonia 3
RS - Serbia 3
TT - Trinidad e Tobago 3
XK - ???statistics.table.value.countryCode.XK??? 3
BB - Barbados 2
BG - Bulgaria 2
CI - Costa d'Avorio 2
EE - Estonia 2
GH - Ghana 2
IR - Iran 2
KW - Kuwait 2
MK - Macedonia 2
MU - Mauritius 2
NG - Nigeria 2
NO - Norvegia 2
Totale 34.971
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Città #
Fairfield 2.174
Singapore 2.121
Warsaw 2.049
Woodbridge 1.738
Ashburn 1.645
Houston 1.299
San Jose 930
Seattle 898
Jacksonville 855
Hong Kong 792
Santa Clara 789
Ann Arbor 774
Wilmington 763
Cambridge 735
Beijing 705
Chandler 622
Izmir 319
Ho Chi Minh City 315
Ferrara 309
Nanjing 280
Hanoi 213
Milan 198
Princeton 196
Tokyo 196
Addison 190
San Diego 180
Los Angeles 179
Lauterbourg 174
Dallas 145
The Dalles 137
Munich 135
Boardman 122
New York 119
Mcallen 113
Mexico City 111
London 109
Montréal 108
São Paulo 104
Shanghai 99
Council Bluffs 96
Helsinki 88
Chicago 81
Nanchang 81
Shenyang 79
Ottawa 75
Jakarta 65
Orem 64
Changsha 62
Dearborn 60
Tianjin 58
Hefei 53
Jiaxing 53
Moscow 52
Hebei 50
Amsterdam 45
Johannesburg 45
Settimo Milanese 44
Brooklyn 43
Da Nang 41
Chennai 40
Atlanta 39
San Mateo 39
Redwood City 38
Montreal 37
Rio de Janeiro 37
Denver 36
Falls Church 36
Phoenix 36
Hangzhou 35
Haiphong 34
Stockholm 34
Jinan 32
Norwalk 32
Manchester 31
San Francisco 31
Frankfurt am Main 29
Vienna 29
Boston 28
Des Moines 28
Poplar 28
Auburn Hills 27
Bologna 26
Columbus 26
Mountain View 26
Brussels 25
Falkenstein 25
Toronto 23
Belo Horizonte 22
Brasília 22
Guangzhou 22
Tashkent 22
Frankfurt An Der Oder 21
Napoli 21
Baghdad 20
Zhengzhou 20
Dhaka 19
Ningbo 19
Nuremberg 19
Amman 17
Campinas 17
Totale 25.323
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Nome #
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 505
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 497
RRAM Reliability/Performance Characterization through Array Architectures Investigations 470
Automated characterization of TAS-MRAM test arrays 410
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 410
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 408
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 402
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 399
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 378
Radiation hard design of HfO2 based 1T1R cells and memory arrays 366
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 364
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 358
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 307
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 298
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 275
Simulations of the software-defined flash 252
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 247
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 243
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 235
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 234
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 232
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 229
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 223
Architectural and Integration Options for 3D NAND Flash Memories 223
A Probabilistic Fault Model for “Analog” Faults in Digital CMOS Circuits 223
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 222
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 219
Reliability challenges in 3D NAND Flash memories 218
Constant charge erasing scheme for Flash Memories 217
Analysis of reliability/performance trade-off in Solid State Drives 215
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 214
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 212
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 211
Fundamental variability limits of filament-based RRAM 211
Dielectric reliability for future logic and Non-Volatile Memory applications: a statistical simulation analysis approach 210
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 210
An automated test equipment for characterization of emerging MRAM and RRAM arrays 210
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 207
Erratic bits in flash memories under Fowler-Nordheim programming 206
Overerase Phenomena: An Insight into Flash memory Reliability 204
Simulation of SSD’s power consumption 202
A new failure mode of very thin (< 50 A) Thermal SiO2 Films 201
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 201
Aliasing in Signature Analysis Testing with Multiple-Input Shift-Registers 199
Statistical Methodologies for Integrated Circuits Design 199
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 198
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 198
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 197
A New Analytical Model of the Erasing Operation in Phase Change Memories 197
A BIST Scheme for Non-Volatile Memories 196
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 195
An Analytical Model for the Aliasing Probability in Signature Analysis Testing 194
Impact of Pulsed Operation on Performance and Reliability of Flash Memories 194
Reliability of 3D NAND Flash Memories 194
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 193
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 193
Advanced Electrical-Level Modeling of EEPROM Cells 190
Bit error rate analysis in Charge Trapping memories for SSD applications 189
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 189
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 187
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 187
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 187
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 186
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 185
Characterization of flash structures erased with ultra-short pulses 183
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 182
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 182
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 182
Erratic bits in Flash memories under Fowler-Nordheim programming 181
Hot Electrons in MOS Transistors: Lateral Distribution of the Trapped Oxide Charge 181
A Novel Critical Path Heuristic for Fast Fault Grading 181
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 181
Resistive RAM technology for SSDs 180
Reliability and performance characterization of a mems-based non-volatile switch 179
Quantum Effects in Accumulation Layers of Si-SiO2 Interfaces in the WKB Effective Mass Approximation 177
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 177
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 176
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 175
Simulations of RRAM-based SSDs 175
Dynamics of Fast-Erasing Bits in Flash Memories 174
Automated Test Equipment for research on Non volatile memories 174
SSDExplorer: A virtual platform for SSD simulations 174
Correlated Fluctuations and Noise Spectra of Tunneling and Substrate Currents Before Breakdown in Thin-Oxide MOS Devices 174
Analysis of Erratic Bits in FLASH Memories 173
Electron trapping/detrapping within thin SiO2 films in the high field tunneling regime 172
Analysis of Erratic Bits in Flash Memories 172
Advanced spice-like modeling of E2PROM cells 170
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 170
Memory driven design methodologies for optimal SSD performance 169
Design trade-offs for NAND flash-based SSDs 168
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 168
Low-Frequency Noise in Silicon-Gate Metal-Oxide-Silicon Capacitors Before Oxide Breakdown 167
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 167
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 167
Correlation between IDDQ Testing Quality and Sensor Accuracy 166
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 166
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 165
Two-Dimensional Effects in Hot-Electron Modified MOSFET's 163
Testing of E2PROM Aging and Endurance: a Case Study 163
Reliability of erasing operation in NOR-Flash memories 163
Totale 22.262
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Categoria #
all - tutte 143.897
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 11.551
Totale 155.448
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021998 0 0 0 0 0 0 0 0 0 539 279 180
2021/20222.125 106 146 157 44 169 126 126 107 116 166 199 663
2022/20231.755 207 17 82 183 230 289 174 167 213 10 139 44
2023/2024721 105 108 21 28 50 38 27 51 17 24 10 242
2024/20254.159 92 181 356 55 451 503 181 316 487 574 653 310
2025/202610.604 924 546 989 1.471 1.773 692 1.315 566 1.106 1.222 0 0
Totale 35.328