In this work the characterization results of 1kbit TAS-MRAM arrays obtained through RIFLE Automated Test Equipment of 1Kbit array are reported. Such ATE, ensuring flexibility in terms of signals and timing, allowed evaluating hysteresis and to perform 50k write cycles in a very limited time, getting a first insight on TAS-MRAM arrays performance and reliability.

Automated characterization of TAS-MRAM test arrays

GROSSI, Alessandro;ZAMBELLI, Cristian;OLIVO, Piero;PELLATI, Paolo;RAMPONI, Michele;
2015

Abstract

In this work the characterization results of 1kbit TAS-MRAM arrays obtained through RIFLE Automated Test Equipment of 1Kbit array are reported. Such ATE, ensuring flexibility in terms of signals and timing, allowed evaluating hysteresis and to perform 50k write cycles in a very limited time, getting a first insight on TAS-MRAM arrays performance and reliability.
2015
ATE, MRAM, arrays
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2338147
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