GROSSI, Alessandro

GROSSI, Alessandro  

Dipartimento di Ingegneria  

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An automated test equipment for characterization of emerging MRAM and RRAM arrays 2018 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Pellati, Paolo; Ramponi, Michele; Wenger, C...hristian; Alvarez-Herault, Jeremy; Mackay, Ken
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 2017 Perez, E; Bondesan, L.; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Wenger, C. h.
Automated characterization of TAS-MRAM test arrays 2015 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Pellati, Paolo; Ramponi, Michele; Alvarez H...erault, Jeremy; Mackay, Ken
Bit error rate analysis in Charge Trapping memories for SSD applications 2014 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero file con accesso da definire
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 2018 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Nowak, Etienne; Molas, Gabriel; Nodin, Jean... Francois; Perniola, Luca
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 2017 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Crespo Yepes, Alberto; Martin Martinez, Jav...ier; Rodríguez, Rosana; Nafria, Monserrat; Perez, Eduardo; Wenger, Christian
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 2016 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Miranda, Enrique; Stikanov, Valeriy; Walczy...k, Christian; Wenger, Christian
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 2014 Zambelli, Cristian; Grossi, Alessandro; Olivo, Piero; D., Walczyk; J., Dabrowski; B., Tillack; T...., Schroeder; R., Kraemer; V., Stikanov; C., Walczyk file con accesso da definire
Emerging non volatile memories reliability 2017 Grossi, Alessandro
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 2018 Grossi, Alessandro; Vianello, Elisa; Zambelli, Cristian; Royer, Pablo; Noel, Jean-Philippe; Girau...d, Bastien; Perniola, Luca; Olivo, Piero; Nowak, Etienne
Fundamental variability limits of filament-based RRAM 2016 Grossi, Alessandro; Nowak, E.; Zambelli, Cristian; Pellissier, C.; Bernasconi, S.; Cibrario, G.; ...Hajjam, K. El; Crochemore, R.; Nodin, J. F.; Olivo, Piero; Perniola, L. file con accesso da definire
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 2015 Grossi, Alessandro; Walczyk, Damian; Zambelli, Cristian; Miranda, Enrique; Olivo, Piero; Stikanov..., Valeriy; Feriani, Alessandro; Sune, Jordi; Schoof, Gunter; Kraemer, Rolf; Tillack, Bernd; Fox, Alexander; Schroeder, Thomas; Wenger, Christian; Walczyk, Christian
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 2017 Pérez, Eduardo; Wenger, Christian; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Roelofs,... Robin
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 2017 Perez, Eduardo; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Wenger, Christian
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 2018 Grossi, Alessandro; Perez, Eduardo; Zambelli, Cristian; Olivo, Piero; Miranda, Enrique; Roelofs, ...Robin; Woodruff, Jacob; Raisanen, Petri; Li, Wei; Givens, Michael; Costina, Ioan; Schubert, Markus Andreas; Wenger, Christian
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 2016 Crupi, Felice; Filice, Francesco; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Perez, Ed...uardo; Wenger, Christian
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 2017 Niu, Gang; Cartoixà, Xavier; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Perez, Eduardo...; Schubert, Markus Andreas; Zaumseil, Peter; Costina, Ioan; Schroeder, Thomas; Wenger, Christian
Memory System Architecture Optimization for Enterprise All-RRAM Solid State Drives 2016 Zuolo, Lorenzo; Zambelli, Cristian; Grossi, Alessandro; Micheloni, Rino; Bates, Stephen; Olivo, P...iero file con accesso da definire
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 2016 Grossi, Alessandro; Perez, Eduardo; Zambelli, Cristian; Olivo, Piero; Wenger, Christian
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 2015 Grossi, Alessandro; Zuolo, Lorenzo; Restuccia, Francesco; Zambelli, Cristian; Olivo, Piero