In this work we present a MEMS-based eNVM concept, designed for sustaining harsh environmental conditions. The endurance and the data retention features are investigated through a set of electrical characterization measurements. A guideline on the physical principles on which the memory relies is also included. © 2011 IEEE.
Characterization of a MEMS-based embedded non volatile memory array for extreme environments
ZAMBELLI, Cristian;OLIVO, Piero;
2011
Abstract
In this work we present a MEMS-based eNVM concept, designed for sustaining harsh environmental conditions. The endurance and the data retention features are investigated through a set of electrical characterization measurements. A guideline on the physical principles on which the memory relies is also included. © 2011 IEEE.File in questo prodotto:
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