This work demonstrates the existence of erratic bits in Flash memories also after Fowler Nordheim programming, i.e. injecting electrons into the floating gate from the channel. Experimental data and statistics allow the evaluation of the consistency of erratic erase physical models adding some useful indications about the influence of the injecting interface morphology on the erratic erase phenomenon

Erratic bits in flash memories under Fowler-Nordheim programming

CHIMENTON, Andrea;PELLATI, Paolo;OLIVO, Piero
2003

Abstract

This work demonstrates the existence of erratic bits in Flash memories also after Fowler Nordheim programming, i.e. injecting electrons into the floating gate from the channel. Experimental data and statistics allow the evaluation of the consistency of erratic erase physical models adding some useful indications about the influence of the injecting interface morphology on the erratic erase phenomenon
2003
Chimenton, Andrea; Pellati, Paolo; Olivo, Piero
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/517092
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