Signature analysis with multiple input shift registers (MISR’s) is often used to realize efficient built-in self-test (BIST) of digital VLSI circuits. Accurate theoretical models of aliasing errors as well as proven criteria for the register design, however, are still missing. This paper presents a statistical theory that explains the dependence of aliasing probability from the main MISR’s features, such as its length and its feedback network, thus permitting the analysis and proof of criteria for the MISR design. Then, exact, as well as simplified expression for the aliasing probability are derived to be used in test pattern design and validation. © 1990 IEEE
Aliasing in Signature Analysis Testing with Multiple-Input Shift-Registers
OLIVO, Piero;
1990
Abstract
Signature analysis with multiple input shift registers (MISR’s) is often used to realize efficient built-in self-test (BIST) of digital VLSI circuits. Accurate theoretical models of aliasing errors as well as proven criteria for the register design, however, are still missing. This paper presents a statistical theory that explains the dependence of aliasing probability from the main MISR’s features, such as its length and its feedback network, thus permitting the analysis and proof of criteria for the MISR design. Then, exact, as well as simplified expression for the aliasing probability are derived to be used in test pattern design and validation. © 1990 IEEEI documenti in SFERA sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
