ZAMBELLI, Cristian
 Distribuzione geografica
Continente #
NA - Nord America 12.617
AS - Asia 6.345
EU - Europa 6.333
SA - Sud America 981
AF - Africa 180
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 4
Totale 26.465
Nazione #
US - Stati Uniti d'America 11.718
PL - Polonia 2.366
SG - Singapore 2.343
CN - Cina 1.605
GB - Regno Unito 928
IT - Italia 927
DE - Germania 910
BR - Brasile 789
CA - Canada 746
VN - Vietnam 657
HK - Hong Kong 592
UA - Ucraina 313
TR - Turchia 276
FR - Francia 229
JP - Giappone 189
FI - Finlandia 156
IN - India 150
RU - Federazione Russa 134
MX - Messico 118
ID - Indonesia 106
SE - Svezia 104
NL - Olanda 94
ZA - Sudafrica 80
BD - Bangladesh 74
AR - Argentina 69
TW - Taiwan 49
IQ - Iraq 46
AT - Austria 44
ES - Italia 43
KR - Corea 43
PK - Pakistan 39
CO - Colombia 29
VE - Venezuela 28
EC - Ecuador 23
TN - Tunisia 21
MA - Marocco 20
PH - Filippine 19
UZ - Uzbekistan 18
SA - Arabia Saudita 16
JO - Giordania 15
LT - Lituania 14
AE - Emirati Arabi Uniti 13
BE - Belgio 13
IL - Israele 13
KE - Kenya 13
MY - Malesia 13
NP - Nepal 13
PY - Paraguay 13
CL - Cile 11
EG - Egitto 11
CZ - Repubblica Ceca 10
AZ - Azerbaigian 8
DO - Repubblica Dominicana 8
DZ - Algeria 8
AL - Albania 7
BO - Bolivia 7
CH - Svizzera 7
CR - Costa Rica 7
PE - Perù 7
SN - Senegal 7
KZ - Kazakistan 6
OM - Oman 6
ET - Etiopia 5
EU - Europa 5
IE - Irlanda 5
KG - Kirghizistan 5
LB - Libano 5
PS - Palestinian Territory 5
AU - Australia 4
BY - Bielorussia 4
HN - Honduras 4
PT - Portogallo 4
RO - Romania 4
AO - Angola 3
IR - Iran 3
KW - Kuwait 3
NO - Norvegia 3
PA - Panama 3
RS - Serbia 3
SY - Repubblica araba siriana 3
TT - Trinidad e Tobago 3
UY - Uruguay 3
AM - Armenia 2
BB - Barbados 2
BG - Bulgaria 2
BH - Bahrain 2
EE - Estonia 2
GA - Gabon 2
GE - Georgia 2
HU - Ungheria 2
JM - Giamaica 2
LK - Sri Lanka 2
LV - Lettonia 2
MU - Mauritius 2
NI - Nicaragua 2
SV - El Salvador 2
BA - Bosnia-Erzegovina 1
BN - Brunei Darussalam 1
CG - Congo 1
CI - Costa d'Avorio 1
Totale 26.450
Città #
Warsaw 2.361
Singapore 1.471
Fairfield 1.294
Ashburn 1.263
Woodbridge 980
Houston 677
San Jose 676
Montréal 610
Mcallen 592
Munich 582
Hong Kong 570
Santa Clara 538
Seattle 536
Beijing 529
Wilmington 459
Cambridge 416
Ann Arbor 401
Jacksonville 376
Ferrara 328
Chandler 281
Ho Chi Minh City 231
Izmir 174
Tokyo 174
Dallas 167
Hanoi 159
Milan 155
The Dalles 142
Los Angeles 138
Nanjing 132
Lauterbourg 115
Princeton 113
Addison 108
New York 106
Council Bluffs 99
London 95
Shanghai 90
San Diego 84
Boardman 82
Jakarta 79
Mexico City 78
São Paulo 76
Helsinki 70
Dearborn 56
Chicago 55
Ottawa 52
Orem 49
Settimo Milanese 49
Johannesburg 47
Chennai 46
Amsterdam 42
Moscow 40
Da Nang 39
Phoenix 39
Tianjin 37
Denver 35
Redwood City 35
Nanchang 34
Atlanta 32
Vienna 32
Brooklyn 31
Changsha 31
Montreal 31
Frankfurt am Main 30
Shenyang 29
Manchester 28
Bologna 27
Boston 27
Columbus 27
Des Moines 27
Falkenstein 27
Hangzhou 27
San Francisco 27
Taipei 27
Hefei 26
Nuremberg 26
Toronto 26
Hebei 24
Mountain View 24
Rio de Janeiro 24
Stockholm 24
Falls Church 23
Norwalk 23
Poplar 23
Dong Ket 22
Frankfurt An Der Oder 21
Napoli 21
Baghdad 20
Jiaxing 20
Guangzhou 19
Haiphong 19
Mumbai 19
Brasília 18
Tashkent 16
The Hague 16
Turku 16
New Delhi 15
Washington 15
Amman 14
Rome 14
Auburn Hills 13
Totale 19.263
Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.181
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 505
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 497
RRAM Reliability/Performance Characterization through Array Architectures Investigations 470
Automated characterization of TAS-MRAM test arrays 410
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 410
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 408
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 402
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 399
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 378
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 367
Radiation hard design of HfO2 based 1T1R cells and memory arrays 366
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 364
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 358
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 307
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 298
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 290
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 275
Simulations of the software-defined flash 252
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 247
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 243
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 235
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 234
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 232
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 229
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 223
Architectural and Integration Options for 3D NAND Flash Memories 223
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 222
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 219
Reliability challenges in 3D NAND Flash memories 218
Analysis of reliability/performance trade-off in Solid State Drives 215
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 214
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 212
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 211
Fundamental variability limits of filament-based RRAM 211
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 210
An automated test equipment for characterization of emerging MRAM and RRAM arrays 210
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 207
Simulation of SSD’s power consumption 202
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 201
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 198
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 197
A New Analytical Model of the Erasing Operation in Phase Change Memories 197
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 195
Reliability of 3D NAND Flash Memories 194
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 193
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 193
Bit error rate analysis in Charge Trapping memories for SSD applications 189
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 189
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 187
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 187
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 187
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 186
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 185
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 182
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 182
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 182
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 181
Resistive RAM technology for SSDs 180
Reliability and performance characterization of a mems-based non-volatile switch 179
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 179
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 177
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 176
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 175
Simulations of RRAM-based SSDs 175
SSDExplorer: A virtual platform for SSD simulations 174
About the intrinsic resistance variability in HfO2-based RRAM devices 172
An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans 169
Memory driven design methodologies for optimal SSD performance 169
Design trade-offs for NAND flash-based SSDs 168
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 168
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 167
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 167
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 166
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 165
Deep-learning survival analysis for patients with calcific aortic valve disease undergoing valve replacement 163
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 163
Machine Learning and Non-volatile Memories 159
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 157
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 157
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 155
Statistical analysis of resistive switching characteristics in ReRAM test arrays 155
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 154
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 153
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 152
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 147
SSD reliability assessment and improvement 146
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 142
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 142
Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis 142
Assessing the role of program suspend operation in 3d nand flash based solid state drives 141
Experimental characterization of SET Seasoning on Phase Change Memory arrays 138
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 137
Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage 136
Low-energy inference machine with multilevel HfO2 RRAM arrays 134
High throughput edit distance computation on FPGA-based accelerators using HLS 133
SSD Reliability 128
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks 125
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention 125
Reliability of NAND Flash Memories 123
Totale 23.492
Categoria #
all - tutte 99.556
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 8.480
Totale 108.036


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021673 0 0 0 0 0 0 0 0 0 412 146 115
2021/20221.220 88 73 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024521 64 60 16 14 38 47 27 38 12 12 13 180
2024/20253.202 70 150 276 59 317 379 149 252 354 443 519 234
2025/20268.502 675 442 747 1.132 1.445 568 1.082 496 935 980 0 0
Totale 26.862