SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

ZAMBELLI, Cristian
 Distribuzione geografica
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Continente #
NA - Nord America 14.054
AS - Asia 6.618
EU - Europa 6.561
SA - Sud America 1.017
Continente sconosciuto - Info sul continente non disponibili 415
AF - Africa 184
OC - Oceania 7
Totale 28.856
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Nazione #
US - Stati Uniti d'America 13.055
SG - Singapore 2.388
PL - Polonia 2.366
CN - Cina 1.664
IT - Italia 1.068
GB - Regno Unito 935
DE - Germania 922
BR - Brasile 811
CA - Canada 792
VN - Vietnam 662
HK - Hong Kong 618
UA - Ucraina 315
TR - Turchia 277
FR - Francia 232
JP - Giappone 193
BD - Bangladesh 176
FI - Finlandia 157
IN - India 155
RU - Federazione Russa 135
SE - Svezia 131
MX - Messico 124
ID - Indonesia 113
NL - Olanda 101
ZA - Sudafrica 80
AR - Argentina 75
TW - Taiwan 52
ES - Italia 49
KR - Corea 47
IQ - Iraq 46
AT - Austria 44
PK - Pakistan 39
CO - Colombia 34
VE - Venezuela 30
EC - Ecuador 23
MA - Marocco 21
TN - Tunisia 21
CR - Costa Rica 20
PH - Filippine 20
UZ - Uzbekistan 18
SA - Arabia Saudita 17
MY - Malesia 16
JO - Giordania 15
NP - Nepal 15
IL - Israele 14
KE - Kenya 14
LT - Lituania 14
AE - Emirati Arabi Uniti 13
BE - Belgio 13
CH - Svizzera 13
PY - Paraguay 13
CL - Cile 12
JM - Giamaica 12
EG - Egitto 11
CZ - Repubblica Ceca 10
GT - Guatemala 10
IS - Islanda 10
DO - Repubblica Dominicana 9
AZ - Azerbaigian 8
DZ - Algeria 8
HN - Honduras 8
AL - Albania 7
AU - Australia 7
BO - Bolivia 7
PE - Perù 7
SN - Senegal 7
IE - Irlanda 6
KZ - Kazakistan 6
LB - Libano 6
OM - Oman 6
PS - Palestinian Territory 6
ET - Etiopia 5
EU - Europa 5
KG - Kirghizistan 5
NI - Nicaragua 5
PT - Portogallo 5
RO - Romania 5
SV - El Salvador 5
BY - Bielorussia 4
TT - Trinidad e Tobago 4
AO - Angola 3
BB - Barbados 3
IR - Iran 3
KW - Kuwait 3
LK - Sri Lanka 3
NO - Norvegia 3
PA - Panama 3
RS - Serbia 3
SY - Repubblica araba siriana 3
UY - Uruguay 3
AM - Armenia 2
BG - Bulgaria 2
BH - Bahrain 2
CW - ???statistics.table.value.countryCode.CW??? 2
EE - Estonia 2
GA - Gabon 2
GE - Georgia 2
HU - Ungheria 2
LV - Lettonia 2
MU - Mauritius 2
SC - Seychelles 2
Totale 28.424
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Città #
Warsaw 2.361
Singapore 1.480
Ashburn 1.411
Fairfield 1.295
Woodbridge 980
San Jose 893
Houston 682
Montréal 610
Santa Clara 609
Hong Kong 595
Mcallen 592
Munich 583
Beijing 552
Seattle 539
Wilmington 460
Cambridge 418
Ann Arbor 401
Jacksonville 378
Council Bluffs 367
Ferrara 330
Chandler 281
Ho Chi Minh City 233
Dallas 180
Milan 180
Izmir 175
Tokyo 175
Los Angeles 174
Hanoi 160
New York 147
The Dalles 143
Nanjing 133
Lauterbourg 115
Princeton 114
Addison 108
London 95
Shanghai 91
San Diego 86
Boardman 83
Mexico City 83
Jakarta 79
São Paulo 78
Helsinki 70
Chicago 65
Dearborn 56
Ottawa 53
Orem 52
Phoenix 52
Settimo Milanese 49
Chennai 48
Johannesburg 47
Brooklyn 43
Toronto 43
Amsterdam 42
Moscow 40
Atlanta 39
Da Nang 39
Tianjin 37
Denver 36
Redwood City 36
Nanchang 34
Montreal 33
San Francisco 33
Changsha 32
Vienna 32
Bologna 30
Boston 30
Columbus 30
Frankfurt am Main 30
Manchester 30
Rome 30
Shenyang 29
Des Moines 28
Hangzhou 28
Falkenstein 27
Taipei 27
Hefei 26
Nuremberg 26
Brasília 25
Buffalo 25
Hebei 24
Mountain View 24
Norwalk 24
Rio de Janeiro 24
Stockholm 24
Falls Church 23
Poplar 23
Washington 23
Dong Ket 22
Frankfurt An Der Oder 21
Napoli 21
Baghdad 20
Jiaxing 20
Guangzhou 19
Haiphong 19
Mumbai 19
The Hague 18
San José 16
Tashkent 16
Turku 16
New Delhi 15
Totale 20.312
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Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.197
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 512
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 508
RRAM Reliability/Performance Characterization through Array Architectures Investigations 480
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 429
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 427
Automated characterization of TAS-MRAM test arrays 420
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 419
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 413
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 394
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 383
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 377
Radiation hard design of HfO2 based 1T1R cells and memory arrays 375
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 366
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 335
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 318
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 312
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 307
Simulations of the software-defined flash 265
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 259
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 256
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 251
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 251
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 245
Architectural and Integration Options for 3D NAND Flash Memories 243
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 242
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 241
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 239
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 232
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 228
Reliability challenges in 3D NAND Flash memories 227
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 226
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 223
Analysis of reliability/performance trade-off in Solid State Drives 222
Fundamental variability limits of filament-based RRAM 221
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 219
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 219
An automated test equipment for characterization of emerging MRAM and RRAM arrays 219
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 218
Simulation of SSD’s power consumption 218
A New Analytical Model of the Erasing Operation in Phase Change Memories 212
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 209
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 208
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 207
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 206
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 204
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 204
Reliability of 3D NAND Flash Memories 203
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 202
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 201
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 201
Deep-learning survival analysis for patients with calcific aortic valve disease undergoing valve replacement 199
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 198
An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans 195
Bit error rate analysis in Charge Trapping memories for SSD applications 195
Resistive RAM technology for SSDs 194
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 194
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 194
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 193
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 193
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 193
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 192
Machine Learning and Non-volatile Memories 187
Reliability and performance characterization of a mems-based non-volatile switch 187
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 186
Simulations of RRAM-based SSDs 183
About the intrinsic resistance variability in HfO2-based RRAM devices 183
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 182
SSDExplorer: A virtual platform for SSD simulations 182
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 181
High throughput edit distance computation on FPGA-based accelerators using HLS 178
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 178
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 177
Design trade-offs for NAND flash-based SSDs 176
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 175
Memory driven design methodologies for optimal SSD performance 174
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 173
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 173
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 172
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 172
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 172
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 166
Statistical analysis of resistive switching characteristics in ReRAM test arrays 162
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 161
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 161
Assessing the role of program suspend operation in 3d nand flash based solid state drives 161
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 160
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 155
Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis 154
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks 153
SSD reliability assessment and improvement 153
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 152
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 151
Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage 149
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 149
Benchmarking a DNN for aortic valve calcium lesions segmentation on FPGA-based DPU using the vitis AI toolchain 147
Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits 147
Low-energy inference machine with multilevel HfO2 RRAM arrays 146
Experimental characterization of SET Seasoning on Phase Change Memory arrays 143
Computational Storage for 3D NAND Flash Error Recovery Flow Prediction 138
Totale 24.832
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Categoria #
all - tutte 114.040
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 9.507
Totale 123.547
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20221.059 0 0 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024521 64 60 16 14 38 47 27 38 12 12 13 180
2024/20253.202 70 150 276 59 317 379 149 252 354 443 519 234
2025/20269.249 675 442 747 1.132 1.445 568 1.082 496 935 1.023 473 231
2026/20271.247 335 529 383 0 0 0 0 0 0 0 0 0
Totale 28.856