SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

ZAMBELLI, Cristian
 Distribuzione geografica
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Continente #
NA - Nord America 8.621
EU - Europa 5.100
AS - Asia 913
Continente sconosciuto - Info sul continente non disponibili 5
AF - Africa 2
OC - Oceania 2
SA - Sud America 2
Totale 14.645
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Nazione #
US - Stati Uniti d'America 7.959
PL - Polonia 2.309
GB - Regno Unito 752
IT - Italia 749
DE - Germania 740
CA - Canada 661
CN - Cina 590
UA - Ucraina 276
TR - Turchia 234
SE - Svezia 80
FR - Francia 72
FI - Finlandia 65
KR - Corea 27
AT - Austria 25
VN - Vietnam 22
TW - Taiwan 13
BE - Belgio 8
NL - Olanda 8
IL - Israele 6
EU - Europa 5
IN - India 5
CH - Svizzera 4
JP - Giappone 4
HK - Hong Kong 3
RO - Romania 3
SG - Singapore 3
AU - Australia 2
ES - Italia 2
IE - Irlanda 2
IR - Iran 2
BG - Bulgaria 1
BR - Brasile 1
CZ - Repubblica Ceca 1
EC - Ecuador 1
EG - Egitto 1
HU - Ungheria 1
ID - Indonesia 1
IQ - Iraq 1
LK - Sri Lanka 1
MA - Marocco 1
ME - Montenegro 1
MY - Malesia 1
PA - Panama 1
PT - Portogallo 1
Totale 14.645
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Città #
Warsaw 2.309
Fairfield 1.294
Woodbridge 980
Houston 666
Montréal 610
Mcallen 592
Ashburn 577
Munich 529
Seattle 526
Wilmington 455
Cambridge 414
Ann Arbor 401
Jacksonville 372
Ferrara 311
Chandler 281
Izmir 171
Beijing 138
Milan 132
Nanjing 132
Princeton 113
Addison 108
San Diego 84
Boardman 64
Dearborn 55
Shanghai 54
Settimo Milanese 49
Ottawa 48
Redwood City 35
Nanchang 34
Changsha 29
Shenyang 28
Hebei 24
Mountain View 24
Tianjin 24
Falls Church 23
Norwalk 23
Des Moines 22
Dong Ket 22
London 22
Vienna 22
Frankfurt An Der Oder 21
Napoli 21
Jiaxing 20
Hangzhou 17
Bologna 14
Auburn Hills 13
Guangzhou 12
Zhengzhou 12
Kunming 11
Phoenix 11
Indiana 10
Los Angeles 9
Orange 9
Chicago 8
Jinan 8
Hounslow 7
Washington 7
Gif-sur-yvette 6
New York 6
Seoul 6
Taipei 6
Bielefeld 5
Brussels 5
Helsinki 5
Ningbo 5
Tappahannock 5
Cagliari 4
Changchun 4
Delft 4
Kidron 4
Paris 4
Redmond 4
Wuhan 4
Benevento 3
Dresden 3
Herent 3
Islington 3
Lanzhou 3
Monza 3
Münster 3
Simi Valley 3
Southwark 3
Verona 3
Yellow Springs 3
Acton 2
Andover 2
Camposampiero 2
Castel Bolognese 2
Castrocaro Terme 2
Centro 2
Cernusco Lombardone 2
Chongqing 2
Den Haag 2
Duncan 2
Edinburgh 2
Hangyang 2
Harbin 2
Hefei 2
Hong Kong 2
Köln 2
Totale 12.149
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Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.086
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 413
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 411
RRAM Reliability/Performance Characterization through Array Architectures Investigations 383
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 312
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 308
Automated characterization of TAS-MRAM test arrays 302
Radiation hard design of HfO2 based 1T1R cells and memory arrays 298
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 296
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 289
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 288
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 282
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 281
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 253
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 177
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 169
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 169
Reliability challenges in 3D NAND Flash memories 165
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 143
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 134
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 131
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 126
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 123
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 122
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 119
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 119
Fundamental variability limits of filament-based RRAM 118
Simulations of the software-defined flash 118
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 117
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 117
Bit error rate analysis in Charge Trapping memories for SSD applications 116
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 114
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 114
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 114
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 111
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 110
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 110
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 109
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 108
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 108
Reliability of 3D NAND Flash Memories 107
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 107
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 107
Analysis of reliability/performance trade-off in Solid State Drives 107
Reliability and performance characterization of a mems-based non-volatile switch 106
SSDExplorer: A virtual platform for SSD simulations 106
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 105
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 105
Architectural and Integration Options for 3D NAND Flash Memories 105
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 105
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 104
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 104
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 103
Statistical analysis of resistive switching characteristics in ReRAM test arrays 103
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 103
Resistive RAM technology for SSDs 103
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 103
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 102
null 101
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 100
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 99
Simulation of SSD’s power consumption 98
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 98
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 97
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 96
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 96
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 95
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 95
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 93
A New Analytical Model of the Erasing Operation in Phase Change Memories 93
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 93
Design trade-offs for NAND flash-based SSDs 92
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 92
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 92
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 91
Simulations of RRAM-based SSDs 90
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 87
null 87
null 87
An automated test equipment for characterization of emerging MRAM and RRAM arrays 87
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 84
null 83
About the intrinsic resistance variability in HfO2-based RRAM devices 83
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 81
SSD reliability assessment and improvement 80
Low-energy inference machine with multilevel HfO2 RRAM arrays 80
Memory driven design methodologies for optimal SSD performance 78
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 78
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 77
Experimental characterization of SET Seasoning on Phase Change Memory arrays 75
SSD Reliability 71
Reliability of NAND Flash Memories 55
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 55
null 52
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention 51
null 47
Dynamic VTH Tracking for Cross-Temperature Suppression in 3D-TLC NAND Flash 45
Temperature impact and programming algorithm for RRAM based memories 29
Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays 29
IIRW 2019 Discussion Group II: Reliability for Aerospace Applications 28
Totale 14.688
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Categoria #
all - tutte 42.941
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 3.798
Totale 46.739
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/20191.495 0 0 0 0 0 0 0 0 0 379 483 633
2019/20204.213 532 214 265 537 332 413 416 355 387 361 214 187
2020/20212.750 251 228 217 247 185 390 190 269 100 412 146 115
2021/20221.220 88 73 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024328 64 60 16 14 38 47 27 38 12 12 0 0
Totale 14.965