SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

ZAMBELLI, Cristian
 Distribuzione geografica
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Continente #
NA - Nord America 9.281
EU - Europa 5.239
AS - Asia 1.495
SA - Sud America 31
Continente sconosciuto - Info sul continente non disponibili 5
AF - Africa 2
OC - Oceania 2
Totale 16.055
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Nazione #
US - Stati Uniti d'America 8.613
PL - Polonia 2.310
IT - Italia 785
DE - Germania 768
GB - Regno Unito 756
CN - Cina 726
CA - Canada 667
SG - Singapore 356
UA - Ucraina 277
TR - Turchia 234
FI - Finlandia 110
SE - Svezia 81
ID - Indonesia 77
FR - Francia 73
KR - Corea 28
AT - Austria 26
BR - Brasile 25
VN - Vietnam 22
NL - Olanda 13
TW - Taiwan 13
BE - Belgio 11
IL - Israele 7
HK - Hong Kong 6
IN - India 6
EU - Europa 5
CH - Svizzera 4
CZ - Repubblica Ceca 4
JP - Giappone 4
ES - Italia 3
IR - Iran 3
LT - Lituania 3
RO - Romania 3
RU - Federazione Russa 3
AR - Argentina 2
AU - Australia 2
BO - Bolivia 2
IE - Irlanda 2
PK - Pakistan 2
PT - Portogallo 2
UZ - Uzbekistan 2
AM - Armenia 1
BD - Bangladesh 1
BG - Bulgaria 1
EC - Ecuador 1
EG - Egitto 1
HU - Ungheria 1
IQ - Iraq 1
JO - Giordania 1
KG - Kirghizistan 1
LA - Repubblica Popolare Democratica del Laos 1
LK - Sri Lanka 1
LV - Lettonia 1
MA - Marocco 1
ME - Montenegro 1
MY - Malesia 1
NO - Norvegia 1
PA - Panama 1
PY - Paraguay 1
SA - Arabia Saudita 1
Totale 16.055
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Città #
Warsaw 2.309
Fairfield 1.294
Woodbridge 980
Houston 666
Montréal 610
Mcallen 592
Ashburn 580
Munich 539
Seattle 526
Santa Clara 504
Wilmington 455
Cambridge 414
Ann Arbor 401
Jacksonville 372
Ferrara 311
Chandler 281
Singapore 259
Izmir 171
Beijing 140
Milan 134
Nanjing 132
Princeton 113
Addison 108
San Diego 84
Boardman 81
Jakarta 75
Shanghai 71
Dearborn 55
Ottawa 50
Settimo Milanese 49
Helsinki 48
Redwood City 35
Nanchang 34
Los Angeles 30
Changsha 29
Shenyang 28
Hebei 24
Mountain View 24
Tianjin 24
Falls Church 23
London 23
Norwalk 23
Vienna 23
Des Moines 22
Dong Ket 22
Frankfurt An Der Oder 21
Napoli 21
Jiaxing 20
Hangzhou 17
Bologna 16
Guangzhou 14
Auburn Hills 13
Zhengzhou 12
Kunming 11
Phoenix 11
Falkenstein 10
Indiana 10
Orange 9
Brussels 8
Chicago 8
Jinan 8
Frankfurt am Main 7
Hounslow 7
New York 7
Washington 7
Gif-sur-yvette 6
Seoul 6
Taipei 6
Toronto 6
Bielefeld 5
Ningbo 5
Tappahannock 5
Cagliari 4
Capaccio 4
Changchun 4
Delft 4
Kidron 4
Paris 4
Redmond 4
Wuhan 4
Benevento 3
Dresden 3
Herent 3
Islington 3
Lanzhou 3
Monza 3
Münster 3
Rome 3
Simi Valley 3
Southwark 3
Tel Aviv 3
Verona 3
Yellow Springs 3
Acton 2
Andover 2
Bardolino 2
Brno 2
Camposampiero 2
Castel Bolognese 2
Castrocaro Terme 2
Totale 13.129
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Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.095
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 426
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 426
RRAM Reliability/Performance Characterization through Array Architectures Investigations 394
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 328
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 327
Automated characterization of TAS-MRAM test arrays 318
Radiation hard design of HfO2 based 1T1R cells and memory arrays 311
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 306
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 299
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 298
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 295
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 291
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 265
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 191
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 183
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 181
Reliability challenges in 3D NAND Flash memories 173
Simulations of the software-defined flash 158
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 158
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 148
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 148
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 145
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 135
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 131
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 131
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 130
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 130
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 129
Fundamental variability limits of filament-based RRAM 129
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 128
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 128
Bit error rate analysis in Charge Trapping memories for SSD applications 127
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 124
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 123
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 122
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 120
Analysis of reliability/performance trade-off in Solid State Drives 120
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 119
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 119
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 117
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 117
Simulation of SSD’s power consumption 117
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 117
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 117
Reliability and performance characterization of a mems-based non-volatile switch 116
Reliability of 3D NAND Flash Memories 116
Architectural and Integration Options for 3D NAND Flash Memories 114
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 114
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 113
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 113
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 113
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 112
SSDExplorer: A virtual platform for SSD simulations 112
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 112
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 111
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 111
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 111
Statistical analysis of resistive switching characteristics in ReRAM test arrays 110
Simulations of RRAM-based SSDs 110
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 110
Resistive RAM technology for SSDs 109
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 107
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 107
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 106
A New Analytical Model of the Erasing Operation in Phase Change Memories 105
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 105
An automated test equipment for characterization of emerging MRAM and RRAM arrays 105
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 104
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 104
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 104
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 102
Design trade-offs for NAND flash-based SSDs 102
null 101
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 99
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 99
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 98
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 98
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 96
About the intrinsic resistance variability in HfO2-based RRAM devices 93
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 90
Memory driven design methodologies for optimal SSD performance 90
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 90
Low-energy inference machine with multilevel HfO2 RRAM arrays 89
null 87
null 87
SSD reliability assessment and improvement 87
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 85
null 83
Experimental characterization of SET Seasoning on Phase Change Memory arrays 82
SSD Reliability 77
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 68
Reliability of NAND Flash Memories 65
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention 60
null 52
Dynamic VTH Tracking for Cross-Temperature Suppression in 3D-TLC NAND Flash 52
null 47
Assessing the role of program suspend operation in 3d nand flash based solid state drives 39
Temperature impact and programming algorithm for RRAM based memories 38
Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays 38
Totale 15.742
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Categoria #
all - tutte 61.626
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 5.451
Totale 67.077
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20202.333 0 0 0 0 0 413 416 355 387 361 214 187
2020/20212.750 251 228 217 247 185 390 190 269 100 412 146 115
2021/20221.220 88 73 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024521 64 60 16 14 38 47 27 38 12 12 13 180
2024/20251.237 70 150 276 59 317 365 0 0 0 0 0 0
Totale 16.395