Nome |
# |
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance, file e309ade2-e9c2-3969-e053-3a05fe0a2c94
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494
|
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms, file e309ade1-c8ea-3969-e053-3a05fe0a2c94
|
342
|
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays, file e309ade1-c8ee-3969-e053-3a05fe0a2c94
|
339
|
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives, file e309ade0-84ff-3969-e053-3a05fe0a2c94
|
296
|
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives, file e309ade2-3fd2-3969-e053-3a05fe0a2c94
|
276
|
Phase Change and Magnetic Memories for Solid-State Drive Applications, file e309ade1-6d6d-3969-e053-3a05fe0a2c94
|
268
|
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2, file e309ade1-c8e8-3969-e053-3a05fe0a2c94
|
268
|
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM, file e309ade2-00f5-3969-e053-3a05fe0a2c94
|
265
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RRAM Reliability/Performance Characterization through Array Architectures Investigations, file e309ade1-c1d0-3969-e053-3a05fe0a2c94
|
257
|
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage, file e309ade1-df06-3969-e053-3a05fe0a2c94
|
255
|
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2, file e309ade1-c8f3-3969-e053-3a05fe0a2c94
|
254
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Radiation hard design of HfO2 based 1T1R cells and memory arrays, file e309ade1-c23e-3969-e053-3a05fe0a2c94
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242
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Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices, file e309ade1-c882-3969-e053-3a05fe0a2c94
|
240
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Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays, file e309ade1-c22a-3969-e053-3a05fe0a2c94
|
224
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ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology, file e309ade1-c230-3969-e053-3a05fe0a2c94
|
213
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Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays, file e309ade2-eea8-3969-e053-3a05fe0a2c94
|
203
|
Automated characterization of TAS-MRAM test arrays, file e309ade1-c1d2-3969-e053-3a05fe0a2c94
|
198
|
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions, file e309ade1-c237-3969-e053-3a05fe0a2c94
|
195
|
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays, file e309ade1-c1cc-3969-e053-3a05fe0a2c94
|
186
|
An automated test equipment for characterization of emerging MRAM and RRAM arrays, file e309ade1-d47b-3969-e053-3a05fe0a2c94
|
160
|
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications, file e309ade2-240f-3969-e053-3a05fe0a2c94
|
150
|
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays, file e309ade0-89ba-3969-e053-3a05fe0a2c94
|
146
|
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories, file e309ade0-bab0-3969-e053-3a05fe0a2c94
|
146
|
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance, file e309ade1-bdf0-3969-e053-3a05fe0a2c94
|
137
|
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers, file e309ade2-eee8-3969-e053-3a05fe0a2c94
|
132
|
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives, file e309ade0-829e-3969-e053-3a05fe0a2c94
|
126
|
Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays, file e309ade4-94c2-3969-e053-3a05fe0a2c94
|
104
|
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks, file e309ade2-4552-3969-e053-3a05fe0a2c94
|
84
|
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices, file e309ade2-386f-3969-e053-3a05fe0a2c94
|
73
|
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays, file e309ade1-8529-3969-e053-3a05fe0a2c94
|
65
|
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests, file e309ade2-0e66-3969-e053-3a05fe0a2c94
|
56
|
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices, file e309ade1-e33f-3969-e053-3a05fe0a2c94
|
49
|
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays, file e309ade1-41fa-3969-e053-3a05fe0a2c94
|
47
|
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention, file e309ade2-48bf-3969-e053-3a05fe0a2c94
|
42
|
IIRW 2019 Discussion Group II: Reliability for Aerospace Applications, file e309ade5-002f-3969-e053-3a05fe0a2c94
|
36
|
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays, file e309ade3-7c51-3969-e053-3a05fe0a2c94
|
33
|
ELECTRICAL CHARACTERIZATION,
PHYSICS, MODELING AND RELIABILITY OF
INNOVATIVE NON-VOLATILE MEMORIES, file e309ade1-d23a-3969-e053-3a05fe0a2c94
|
23
|
Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits, file e309ade4-fe6e-3969-e053-3a05fe0a2c94
|
16
|
First Evidence of Temporary Read Errors in TLC 3D-NAND Flash Memories Exiting from an Idle State, file e309ade2-79ac-3969-e053-3a05fe0a2c94
|
13
|
Editorial for the special issue on flash memory devices, file e309ade5-4003-3969-e053-3a05fe0a2c94
|
10
|
A scalable bidimensional randomization scheme for tlc 3d nand flash memories, file e309ade4-fe6c-3969-e053-3a05fe0a2c94
|
9
|
Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis, file e309ade5-18ad-3969-e053-3a05fe0a2c94
|
9
|
Mitigating self-heating in solid state drives for industrial internet-of-things edge gateways, file e309ade2-ae2d-3969-e053-3a05fe0a2c94
|
8
|
Assessing the role of program suspend operation in 3d nand flash based solid state drives, file e309ade5-2c17-3969-e053-3a05fe0a2c94
|
6
|
An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans, file 4b14e941-1a2b-4247-a24d-4686d6e580c9
|
5
|
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks, file b9ed72c1-fa12-4384-b3f8-1dbb64da6d01
|
4
|
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives, file e309ade0-7d74-3969-e053-3a05fe0a2c94
|
3
|
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs, file e309ade1-fb50-3969-e053-3a05fe0a2c94
|
3
|
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage, file e309ade3-7bc1-3969-e053-3a05fe0a2c94
|
3
|
Reliability of 3D NAND Flash Memories, file e309ade0-ce30-3969-e053-3a05fe0a2c94
|
2
|
null, file e309ade0-d455-3969-e053-3a05fe0a2c94
|
2
|
Fundamental variability limits of filament-based RRAM, file e309ade1-4441-3969-e053-3a05fe0a2c94
|
2
|
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications, file e309ade1-6d26-3969-e053-3a05fe0a2c94
|
2
|
Architectural and Integration Options for 3D NAND Flash Memories, file e309ade1-71d7-3969-e053-3a05fe0a2c94
|
2
|
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices, file e309ade2-01a1-3969-e053-3a05fe0a2c94
|
2
|
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives, file e309ade3-86e4-3969-e053-3a05fe0a2c94
|
2
|
Experimental verification and benchmark of in-memory principal component analysis by crosspoint arrays of resistive switching memory, file 77e4ee6a-69ec-4c82-8dd6-74911af77586
|
1
|
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories, file caf8bcf3-a0f2-4538-8088-8a2b64dee2da
|
1
|
Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs, file d783d3e9-cc46-47b3-8c9f-7b9be9b31944
|
1
|
null, file e309ade0-54ec-3969-e053-3a05fe0a2c94
|
1
|
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives, file e309ade0-6c24-3969-e053-3a05fe0a2c94
|
1
|
Statistical analysis of resistive switching characteristics in ReRAM test arrays, file e309ade0-801d-3969-e053-3a05fe0a2c94
|
1
|
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance, file e309ade1-ce90-3969-e053-3a05fe0a2c94
|
1
|
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories, file e309ade2-32c1-3969-e053-3a05fe0a2c94
|
1
|
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing, file e309ade2-376a-3969-e053-3a05fe0a2c94
|
1
|
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD, file e309ade2-72a5-3969-e053-3a05fe0a2c94
|
1
|
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays, file e309ade3-0028-3969-e053-3a05fe0a2c94
|
1
|
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives, file e309ade3-7258-3969-e053-3a05fe0a2c94
|
1
|
Optimized programming algorithms for multilevel RRAM in hardware neural networks, file e309ade5-02b2-3969-e053-3a05fe0a2c94
|
1
|
Low-energy inference machine with multilevel HfO2 RRAM arrays, file e309ade5-11d0-3969-e053-3a05fe0a2c94
|
1
|
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories, file e309ade5-9a60-3969-e053-3a05fe0a2c94
|
1
|
Totale |
6.742 |