CHIMENTON, Andrea
 Distribuzione geografica
Continente #
NA - Nord America 3.530
EU - Europa 639
AS - Asia 569
AF - Africa 1
Continente sconosciuto - Info sul continente non disponibili 1
Totale 4.740
Nazione #
US - Stati Uniti d'America 3.513
CN - Cina 363
UA - Ucraina 231
TR - Turchia 108
DE - Germania 101
GB - Regno Unito 99
SG - Singapore 91
IT - Italia 87
FI - Finlandia 54
SE - Svezia 34
CA - Canada 17
BE - Belgio 10
FR - Francia 8
RU - Federazione Russa 6
KR - Corea 4
NL - Olanda 4
ES - Italia 2
CZ - Repubblica Ceca 1
EU - Europa 1
HR - Croazia 1
HU - Ungheria 1
JP - Giappone 1
LK - Sri Lanka 1
MA - Marocco 1
TW - Taiwan 1
Totale 4.740
Città #
Fairfield 573
Woodbridge 492
Houston 311
Jacksonville 248
Seattle 216
Ashburn 211
Ann Arbor 201
Cambridge 195
Wilmington 192
Chandler 146
Santa Clara 110
Nanjing 82
Izmir 77
Beijing 63
Singapore 63
Princeton 50
San Diego 48
Addison 47
Boardman 45
Ferrara 31
Milan 31
Nanchang 29
Shenyang 27
Shanghai 23
Los Angeles 20
Jiaxing 18
Ottawa 17
Changsha 13
Auburn Hills 12
Brussels 10
Tianjin 10
Hebei 9
Settimo Milanese 9
London 8
Mountain View 8
Ningbo 8
Xian 8
Dearborn 7
Redwood City 7
San Mateo 7
Falls Church 6
Helsinki 6
Verona 6
Indiana 5
Kunming 5
Norwalk 5
Guangzhou 4
Jinan 4
Zhengzhou 4
Amsterdam 3
Changchun 3
Orange 3
Philadelphia 3
Bologna 2
Chicago 2
Clifton 2
Hangzhou 2
New York 2
Taizhou 2
Venice 2
Acton 1
Budapest 1
Chiswick 1
Dambulla 1
Des Moines 1
Detroit 1
Dresden 1
Izhevsk 1
Kilburn 1
Lanzhou 1
Madrid 1
Qingdao 1
Redmond 1
Rome 1
Saint Petersburg 1
San Jose 1
Santa Cruz de Tenerife 1
Simi Valley 1
Solingen 1
Southwark 1
Taipei 1
Tappahannock 1
Tokyo 1
Wandsworth 1
Washington 1
Yellow Springs 1
Zagreb 1
Zlatoust 1
Totale 3.781
Nome #
Impact of Pulsed Operation on Performance and Reliability of Flash Memories 126
Statistical Methodologies for Integrated Circuits Design 126
Overerase Phenomena: An Insight into Flash memory Reliability 126
Constant charge erasing scheme for Flash Memories 125
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 120
Erratic bits in flash memories under Fowler-Nordheim programming 118
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 117
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 116
Reliability and performance characterization of a mems-based non-volatile switch 114
Monte-Carlo Simulations of Flash Memory Array Retention 112
Reliability of erasing operation in NOR-Flash memories 112
Dielectric reliability for future logic and Non-Volatile Memory applications: a statistical simulation analysis approach 112
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 111
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 110
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 109
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 108
Improving performance and reliability of NOR-Flash arrays by using pulsed operation 107
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 105
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 104
Dynamics of Fast-Erasing Bits in Flash Memories 103
Electrical Characterization and Modeling of Phase Change Memory arrays 103
Impact of Tunnel Oxide Thickness on Erratic Erase in Flash Memories 103
Erratic bits in Flash memories under Fowler-Nordheim programming 102
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 102
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 102
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 102
Fast Identification of Critical Electrical Disturbs in Nonvolatile Memories 101
A New Analytical Model of the Erasing Operation in Phase Change Memories 101
Impact of High Tunneling Electric Fields on Erasing Instabilities in NOR-Flash Memories 100
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 100
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 99
Flash Memory Reliability: an improvement against Erratic Erase phenomena using the Constant Charge Erasing Scheme 98
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 96
Reliability of Floating Gate Memories 95
Analysis of Erratic Bits in Flash Memories 95
Flash Memory Reliability: an Improvement Against Erratic Erase Phenomena Using the Constant Charge Erasing Scheme 90
Analysis of Erratic Bits in FLASH Memories 89
Ultra-short pulses improving performance and reliability in flash memories 88
Drain-accelerated degradation of tunnel oxides in Flash memories 86
Reliability of Flash Memory Erasing Operation under High Tunneling Electric Fields 84
Reliability in Wireless Systems 83
Experimental characterization of SET Seasoning on Phase Change Memory arrays 80
Erratic Erase in Flash Memories (part I): Basic Experimental and Statistical Characterization 76
Erratic Erase in Flash Memories (Part II): Dependence on Operating Conditions 72
Affidabilità di sistemi wireless 68
Reliability of NAND Flash Memories 63
Generation rate of Erratic bits in Flash Memories 60
Pulsed Tunnel Operating Non Volatile Flash Memories with SILC Reduction 39
Anomalous charge loss from Floating-Gate Memory Cells due to heavy ions irradiation 11
Totale 4.769
Categoria #
all - tutte 21.050
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 1.312
Totale 22.362


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020743 0 0 0 0 89 124 121 129 99 96 57 28
2020/2021621 65 73 13 77 22 74 31 78 17 82 61 28
2021/2022571 13 81 66 11 13 23 33 27 15 36 72 181
2022/2023423 51 2 13 47 62 78 27 36 63 2 29 13
2023/2024185 36 23 6 9 6 5 6 20 7 13 0 54
2024/2025269 29 53 76 4 107 0 0 0 0 0 0 0
Totale 4.769