BOSI, Gianni

BOSI, Gianni  

Dipartimento di Ingegneria  

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Risultati 1 - 20 di 64 (tempo di esecuzione: 0.017 secondi).
Titolo Data di pubblicazione Autore(i) File
150-nm GaN HEMT Degradation under Realistic Load-Line Operation 2022 Raffo, A.; Vadala, V.; Bosi, G.; Giofre, R.; Vannini, G.
200-W GaN PA Design Based on Accurate Multicell Transistor Modeling 2022 Vadala, V.; Raffo, A.; Bosi, G.; Barsegyan, A.; Custer, J.; Formicone, G.; Walker, J.; Vannini, G.
75-VDC GaN technology investigation from a degradation perspective 2017 Trevisan, Francesco; Raffo, Antonio; Bosi, Gianni; Vadala', Valeria; Vannini, Giorgio; Formicone,... Gabriele; Burger, Jeff; Custer, James file con accesso da definire
A Comprehensive Overview of the Temperature-Dependent Modeling of the High-Power GaN HEMT Technology Using mm-Wave Scattering Parameter Measurements (Invited Paper) 2023 Crupi, G.; Latino, M.; Gugliandolo, G.; Marinkovic, Z.; Cai, J.; Bosi, G.; Raffo, A.; Fazio, E.; ...Donato, N.
A GaN power amplifier for 100 VDC bus in GPS L-band 2017 Formicone, G.; Burger, J.; Custer, J.; Veitschegger, W.; Bosi, Gianni; Raffo, Antonio; Vannini, G...iorgio file con accesso da definire
A Load–Pull Characterization Technique Accounting for Harmonic Tuning 2013 Vadala', Valeria; Raffo, Antonio; S., Di Falco; Bosi, Gianni; Nalli, Andrea; Vannini, Giorgio file con accesso da definire
A neural network approach for nonlinear modelling of LDMOSFETs 2014 Marinkovic, Zlatica; Crupi, Giovanni; Raffo, Antonio; Bosi, Gianni; Avolio, Gustavo; Markovic, Ve...ra; Caddemi, Alina; Vannini, Giorgio; Schreurs, Dominique M. M. P. file con accesso da definire
A New Calibration Technique of Electromagnetic Simulators for Accurate Analyses of Microwave Components on Epitaxial Wafers 2024 Kikuchi, K; Raffo, A; Vadalà, V; Bosi, G; Vannini, G; Yamamoto, H file con accesso da definire
A new description of fast charge-trapping effects in GaN FETs 2015 Bosi, Gianni; Raffo, Antonio; Vadala', Valeria; Vannini, Giorgio file con accesso da definire
A New Modeling Technique for Microwave Multicell Transistors Based on EM Simulations 2020 Raffo, A.; Vadala, V.; Yamamoto, H.; Kikuchi, K.; Bosi, G.; Ui, N.; Inoue, K.; Vannini, G.
A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation 2023 Bosi, G.; Raffo, A.; Vadala, V.; Giofre, R.; Crupi, G.; Vannini, G. file con accesso da definire
Accurate Modeling of GaN HEMTs Oriented to Analysis of Kink Effects in S22and h21: An Effective Machine Learning Approach 2024 Zhu, Z.; Bosi, G.; Raffo, A.; Crupi, G.; Cai, J. file con accesso da definire
Active Balun Design for Next-Generation Telecom Satellite Frequency Converters 2023 Resca, D.; Bosi, G.; Biondi, A.; Cariani, L.; Vadala, V.; Scappaviva, F.; Raffo, A.; Vannini, G.
Advanced Measurement Techniques for Nonlinear Modelling of GaN HEMTs: From L-band to mm-Wave Applications 2021 Vadalà, Valeria; Raffo, A.; Bosi, Gianni; Giofrè, Rocco; Vannini, Giorgio
Advanced Modelling Techniques Enabling E-Band Power Amplifier Design for 5G Backhauling 2021 Vadala, V.; Raffo, A.; Colzani, A.; Fumagalli, M. A.; Sivverini, G.; Bosi, G.; Vannini, G. file con accesso da definire
Advances in Ku-Band GaN Single Chip Front End for Space SARs: From System Specifications to Technology Selection 2022 Scappaviva, F.; Bosi, G.; Biondi, A.; D'Angelo, S.; Cariani, L.; Vadala, V.; Raffo, A.; Resca, D....; Cipriani, E.; Vannini, G.
An ultra-wideband sensing board for radio frequency front-end in IoT transmitters 2019 Petrocchi, A.; Raffo, A.; Bosi, G.; Avolio, G.; Resca, D.; Vannini, G.; Schreurs, D.
An Ultra-Wideband Setup to Monitor Antenna-Impedance Variations in Low-Cost IoT Transmitters 2018 Petrocchi, Alessandra; Raffo, A.; Bosi, G.; Vannini, G.; Yavuz Kapusuz, K.; Lemey, S.; Rogier, H....; Avolio, G.; Schreurs, D.
An Unconventional Measurement Technique for the Nonlinear Characterization of mm-Wave GaN HEMT 2023 Vadalà, Valeria; Raffo, Antonio; Bosi, Gianni; Giofrè, Rocco; Colantonio, Paolo; Vannini, Giorgio file con accesso da definire
Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers 2022 Yamamoto, H.; Kikuchi, K.; Vadala, V.; Bosi, G.; Raffo, A.; Vannini, G.