VADALA', Valeria

VADALA', Valeria  

Dipartimento di Ingegneria  

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Risultati 1 - 20 di 72 (tempo di esecuzione: 0.034 secondi).
Titolo Data di pubblicazione Autore(i) File
75-VDC GaN technology investigation from a degradation perspective 2017 Trevisan, Francesco; Raffo, Antonio; Bosi, Gianni; Vadala', Valeria; Vannini, Giorgio; Formicone,... Gabriele; Burger, Jeff; Custer, James file con accesso da definire
A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices 2011 Raffo, Antonio; Vadala', Valeria; P. A., Traverso; A., Santarelli; Vannini, Giorgio; F., Filicori file con accesso da definire
A Load–Pull Characterization Technique Accounting for Harmonic Tuning 2013 Vadala', Valeria; Raffo, Antonio; S., Di Falco; Bosi, Gianni; Nalli, Andrea; Vannini, Giorgio file con accesso da definire
A Low-Cost and Accurate Technique for the Prediction of Load-Pull Contours 2010 Vadala', Valeria; Raffo, Antonio; DI FALCO, Sergio; Vannini, Giorgio file con accesso da definire
A new approach to Class-E power amplifier design 2011 A., Musio; Vadala', Valeria; F., Scappaviva; Raffo, Antonio; DI FALCO, Sergio; Vannini, Giorgio file con accesso da definire
A new description of fast charge-trapping effects in GaN FETs 2015 Bosi, Gianni; Raffo, Antonio; Vadala', Valeria; Vannini, Giorgio file con accesso da definire
A New Dynamic-Bias Measurement Setup for Nonlinear Transistor Model Identification 2017 Vadala', Valeria; Raffo, Antonio; Avolio, Gustavo; Marchetti, Mauro; Schreurs, Dominique M. M. P....; Vannini, Giorgio
A New Empirical Model for the Characterization of Low-Frequency Dispersive Effects in FET Electron Devices Accounting for Thermal Influence on the Trapping State 2008 Raffo, Antonio; Vadala', Valeria; Vannini, Giorgio; A., Santarelli file con accesso da definire
A New Modeling Technique for Microwave Multicell Transistors Based on EM Simulations 2020 Raffo, A.; Vadala, V.; Yamamoto, H.; Kikuchi, K.; Bosi, G.; Ui, N.; Inoue, K.; Vannini, G.
A new study on the temperature and bias dependence of the kink effects in S22 and h21 for the GaN HEMT technology 2018 Crupi, Giovanni; Raffo, Antonio; Vadalà, Valeria; Vannini, Giorgio; Caddemi, Alina
A Non-Quasi-Static FET Model Extraction Procedure Using the Dynamic-Bias Technique 2015 Raffo, Antonio; Avolio, Gustavo; Vadala', Valeria; Schreurs, Dominique M. M. P.; Vannini, Giorgio
A procedure for the extraction of a nonlinear microwave GaN FET model 2017 Avolio, Gustavo; Vadala', Valeria; Angelov, Iltcho; Raffo, Antonio; Marchetti, Mauro; Vannini, Gi...orgio; Schreurs, Dominique file con accesso da definire
A streamlined drain-lag model for GaN HEMTs based on pulsed S-parameter measurements 2019 Luo, Peng; Schnieder, Frank; Bengtsson, Olof; Vadalà, Valeria; Raffo, Antonio; Heinrich, Wolfgang...; Rudolph, Matthias
Accurate GaN HEMT nonquasi-static large-signal model including dispersive effects 2011 G., Crupi; Raffo, Antonio; D. M. M. P., Schreurs; G., Avolio; Vadala', Valeria; DI FALCO, Sergio;... A., Caddemi; Vannini, Giorgio file con accesso da definire
Advanced Measurement Techniques for Nonlinear Modelling of GaN HEMTs: From L-band to mm-Wave Applications 2021 Vadalà, Valeria; Raffo, A.; Bosi, Gianni; Giofrè, Rocco; Vannini, Giorgio
An Improved Transistor Modeling Methodology Exploiting the Quasi-Static Approximation 2021 Jarndal, A.; Crupi, G.; Raffo, A.; Vadala', V.; Vannini, G.
An Innovative Two-Source Large-Signal Measurement System for the Characterization of Low-Frequency Dispersive Effects in FETs 2008 Raffo, Antonio; Vadala', Valeria; P. A., Traverso; A., Santarelli; Vannini, Giorgio; F., Filicori file con accesso da definire
Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers 2018 Yamamoto, Hiroshi; Kikuchi, Ken; Ui, Norihiko; Inoue, Kazutaka; Vadala, Valeria; Bosi, Gianni; Ra...ffo, Antonio; Vannini, Giorgio
Assessing GaN FET Performance Degradation in Power Amplifiers for Pulsed Radar Systems 2018 Raffo, Antonio; Avolio, Gustavo; Vadala', Valeria; Bosi, Gianni; Vannini, Giorgio; Schreurs, Domi...nique
Behavioral Modeling of GaN FETs: a Load-Line Approach 2014 Raffo, Antonio; Bosi, Gianni; Vadala', Valeria; Vannini, Giorgio file con accesso da definire