DI GIACOMO, Valeria
 Distribuzione geografica
Continente #
NA - Nord America 905
EU - Europa 352
AS - Asia 181
AF - Africa 1
Continente sconosciuto - Info sul continente non disponibili 1
Totale 1.440
Nazione #
US - Stati Uniti d'America 904
PL - Polonia 136
CN - Cina 125
UA - Ucraina 80
GB - Regno Unito 41
DE - Germania 34
TR - Turchia 32
IT - Italia 26
SG - Singapore 18
FI - Finlandia 16
SE - Svezia 15
BE - Belgio 2
IN - India 2
VN - Vietnam 2
A2 - ???statistics.table.value.countryCode.A2??? 1
CA - Canada 1
EG - Egitto 1
ES - Italia 1
HR - Croazia 1
ID - Indonesia 1
TW - Taiwan 1
Totale 1.440
Città #
Warsaw 136
Fairfield 120
Houston 104
Ashburn 101
Jacksonville 86
Woodbridge 82
Ann Arbor 55
Seattle 47
Beijing 43
Wilmington 41
Chandler 40
Cambridge 39
Nanjing 37
Princeton 24
Izmir 22
San Diego 15
Singapore 12
Boardman 11
Nanchang 8
Shenyang 8
Ferrara 6
Redwood City 6
Auburn Hills 5
Hebei 5
Jinan 5
Mountain View 5
Philadelphia 5
San Mateo 5
Washington 5
Cagliari 4
Changsha 4
Los Angeles 4
Milan 4
Tianjin 4
Des Moines 3
Jiaxing 3
London 3
Bologna 2
Dong Ket 2
Guangzhou 2
Indiana 2
New Bedfont 2
Ningbo 2
Norwalk 2
Tappahannock 2
Zhengzhou 2
Addison 1
Atlanta 1
Barcelona 1
Edinburgh 1
Falls Church 1
Haikou 1
Jakarta 1
Kharagpur 1
Kraainem 1
Lappeenranta 1
Modena 1
New York 1
Noto 1
Orange 1
Prescot 1
Redmond 1
Stockholm 1
Taipei 1
Taizhou 1
Trivandrum 1
Verona 1
Victoria 1
Wandsworth 1
Zagreb 1
Totale 1.149
Nome #
ELECTRON DEVICE NONLINEAR MODELLING FOR MICROWAVE CIRCUIT DESIGN 177
Nonquasi-Static Large-Signal Model of GaN FETs through an Equivalent Voltage Approach 121
Breakdown Walkout Investigation in Electron Devices Under Nonlinear Dynamic Regime 113
A Nonquasi-Static Empirical Model of Electron Devices 111
Accurate Nonlinear Electron Device Modelling for Cold FET Mixer Design 107
Nonlinear modeling of InP devices for W-band applications 102
An Automated Measurement System for the Characterization of Electron Device Degradation under Nonlinear Dynamic Regime 100
Empirical Investigation on Time Dispersion of Microwave Electron Device Characteristics under Nonlinear Dynamic Operating Conditions 100
Low-frequency dynamic drain current modeling in AlGaN-GaN HEMTs 93
Optimal function approximation for empirical look-up-table device models 71
Optimal Function Approximation For Empirical Look-Up-Table Device Models 65
Un innovativo sistema di misura per la caratterizzazione della dispersione temporale in regime statico e dinamico dei dispositivielettronici a microonde 61
Accurate small- and large-signal predictions using a simple, non-quasi-static, empirical model 59
Electron Device Modelling for Millimeter-Wave Wideband Wireless Systems 59
Nonquasi-static Nonlinear Modelling of Electron Devices 55
Behavioral modeling and digital predistortion for the linearization of a mm-wave Power Amplifier 54
Totale 1.448
Categoria #
all - tutte 5.051
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.051


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020375 58 17 15 50 21 36 27 32 27 45 36 11
2020/2021212 22 27 12 19 12 22 6 26 2 28 20 16
2021/2022153 1 30 14 2 3 4 7 5 5 11 13 58
2022/2023119 17 0 3 11 18 22 3 12 18 2 11 2
2023/2024105 8 8 13 2 14 20 14 10 0 0 0 16
2024/20253 3 0 0 0 0 0 0 0 0 0 0 0
Totale 1.448