SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

FAVALLI, Michele
 Distribuzione geografica
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Continente #
NA - Nord America 3.626
AS - Asia 1.527
EU - Europa 799
SA - Sud America 256
AF - Africa 24
OC - Oceania 3
Continente sconosciuto - Info sul continente non disponibili 2
Totale 6.237
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Nazione #
US - Stati Uniti d'America 3.577
SG - Singapore 592
CN - Cina 494
UA - Ucraina 220
BR - Brasile 219
HK - Hong Kong 155
IT - Italia 135
DE - Germania 125
TR - Turchia 103
VN - Vietnam 103
GB - Regno Unito 96
FI - Finlandia 57
RU - Federazione Russa 47
SE - Svezia 42
MX - Messico 31
FR - Francia 27
AR - Argentina 20
IN - India 19
PL - Polonia 18
CA - Canada 15
JP - Giappone 14
ZA - Sudafrica 10
BD - Bangladesh 8
ID - Indonesia 8
UZ - Uzbekistan 7
LT - Lituania 6
BE - Belgio 5
ES - Italia 5
CO - Colombia 4
EC - Ecuador 4
IQ - Iraq 4
RS - Serbia 4
AE - Emirati Arabi Uniti 3
AT - Austria 3
IL - Israele 3
PE - Perù 3
PY - Paraguay 3
AU - Australia 2
BG - Bulgaria 2
DO - Repubblica Dominicana 2
DZ - Algeria 2
EE - Estonia 2
EG - Egitto 2
EU - Europa 2
KE - Kenya 2
KZ - Kazakistan 2
MA - Marocco 2
NL - Olanda 2
PK - Pakistan 2
TN - Tunisia 2
AM - Armenia 1
BH - Bahrain 1
CI - Costa d'Avorio 1
CL - Cile 1
CZ - Repubblica Ceca 1
ET - Etiopia 1
GM - Gambi 1
IE - Irlanda 1
JM - Giamaica 1
JO - Giordania 1
KI - Kiribati 1
KW - Kuwait 1
LU - Lussemburgo 1
MN - Mongolia 1
NP - Nepal 1
PS - Palestinian Territory 1
SA - Arabia Saudita 1
SC - Seychelles 1
TJ - Tagikistan 1
TW - Taiwan 1
UY - Uruguay 1
VE - Venezuela 1
Totale 6.237
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Città #
Woodbridge 481
Fairfield 436
Ashburn 348
Singapore 317
Houston 269
Jacksonville 222
Santa Clara 210
Beijing 185
Seattle 184
Chandler 159
Wilmington 159
Hong Kong 155
Cambridge 150
Ann Arbor 131
Izmir 85
Nanjing 79
Milan 53
Ho Chi Minh City 48
Princeton 47
Addison 44
Los Angeles 43
Boardman 38
San Diego 35
Mexico City 25
Ferrara 24
Shanghai 23
Shenyang 22
Hanoi 21
New York 21
Dallas 16
Warsaw 16
Stockholm 15
São Paulo 15
Hebei 14
Hefei 14
Helsinki 14
Nanchang 14
Tokyo 12
Bologna 11
Jiaxing 11
London 11
Rio de Janeiro 11
Brooklyn 10
Buffalo 10
Denver 10
Norwalk 10
Tianjin 10
Montreal 9
Chicago 8
Moscow 8
Munich 8
The Dalles 8
Atlanta 7
Orem 7
Redondo Beach 7
Tashkent 7
Boston 6
Changsha 6
Chennai 6
Falkenstein 6
Hangzhou 6
Jinan 6
Mountain View 6
Ningbo 6
San Francisco 6
Brussels 5
Caxias do Sul 5
Guangzhou 5
Indiana 5
Johannesburg 5
Redwood City 5
Zhengzhou 5
Auburn Hills 4
Campinas 4
Changchun 4
Da Nang 4
Frankfurt am Main 4
Goiânia 4
Haiphong 4
Miami 4
New Bedfont 4
New Delhi 4
Poplar 4
Recife 4
Salvador 4
San Mateo 4
Verona 4
Belo Horizonte 3
Biên Hòa 3
Harbin 3
Jakarta 3
Joinville 3
Kunming 3
Niš 3
Nuremberg 3
Pensacola 3
Porto Alegre 3
Raleigh 3
Ribeirão Preto 3
Rome 3
Totale 4.495
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Nome #
A SAT Based Test Generation Method for Delay Fault Testing of Macro Based Circuits 216
Boolean and Pseudo-Boolean Test Generation for Feedback Bridging Faults 203
A fuzzy model for path delay fault detection 186
A Probabilistic Fault Model for “Analog” Faults in Digital CMOS Circuits 180
Diversity analysis in the presence of delay faults affecting duplex systems 178
A Built-In Self-Testing Framework for Asynchronous Bundled-Data NoC Switches Resilient to Delay Variations 178
Bridging fault modeling and simulation for deep submicron CMOS ICs 172
Concurrent detection of power supply noise 167
Annotated bit flip fault model 162
Exploiting Network-on-Chip Structural Redundancy for A Cooperative and Scalable Built-In Self-Test Architecture 162
"Victim gate" crosstalk fault model 160
Power efficiency of switch architecture extensions for fault tolerant NoC design 149
System-Level Infrastructure for Boot-time Testing and Configuration of Networks-on-Chip with Programmable Routing Logic 146
Bus crosstalk fault-detection capabilities of error-detecting codes for on-line testing 143
Correlation between IDDQ Testing Quality and Sensor Accuracy 142
Testing Resistive Opens and Bridging Faults Through Pulse Propagation 141
Signal Coding and CMOS Gates for Combinational Functional Blocks of Very Deep Submicron Self-Checking Circuits 141
A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices 141
Concurrent checking of clock signal correctness 134
High quality test vectors for bridging faults in the presence of IC's parameters variations 133
How many test vectors we need to detect a bridging fault? 130
Self-checking scheme for the on-line testing of power supply noise 128
Bridging Faults in Pipelined Circuits Journal of Electronic Testing, Theory and Applications 128
Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults 127
Pulse propagation for the detection of small delay defects 125
TMR voting in the presence of crosstalk faults at the voter inputs 125
Optimization of error detecting codes for the detection of crosstalk originated errors 124
Delay fault detection problems in circuits featuring a low combinational depth 122
Problems due to open faults in the interconnections of self-checking data-paths 122
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 119
Modeling and Simulation of Broken Connections in CMOS ICs 116
On-Chip Clock Faults' Detector 114
Self-checking detection and diagnosis of transient, delay, and crosstalk faults affecting bus lines 112
Enabling testability of fault-tolerant circuits by means of I-DDQ-checkable voters 106
Regression models for behavioral power estimation 105
Efficient Resource-Aware Neural Architecture Search with a Neuro-Symbolic Approach 105
null 99
Symbolic handling of bridging fault effects 97
null 94
null 92
Single Output Distribute Two-Rail Checker with Diagnosing Capabilities for Bus Based Self-Checking Architectures 89
Test pattern generation for iddq: increasing test quality 88
null 84
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits 82
A Complete Self-Testing and Self-Configuring NoC Infrastructure for Cost-Effective MPSoCs 78
An evolutionary approach to the design of on chip pseudorandom test generators 74
Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits 55
The challenge of classification confidence estimation in dynamically-adaptive neural networks 54
Exploring Software Models for the Resilience Analysis of Deep Learning Accelerators: the NVDLA Case Study 53
Online testing approach for very deep-submicron ICs 51
null 48
Fine-Grained Timing Analysis of Digital Integrated Circuits in Answer Set Programming 11
Totale 6.291
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Categoria #
all - tutte 29.357
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 29.357
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021329 0 0 0 0 0 82 11 74 11 79 47 25
2021/2022460 14 39 40 20 16 24 33 22 10 38 47 157
2022/2023439 51 0 4 49 73 66 42 46 65 1 24 18
2023/2024190 27 22 9 6 16 11 16 12 5 3 6 57
2024/2025835 12 22 91 5 98 117 45 26 79 170 107 63
2025/20261.521 246 128 275 377 450 45 0 0 0 0 0 0
Totale 6.291