SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

FAVALLI, Michele
 Distribuzione geografica
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Continente #
NA - Nord America 3.668
AS - Asia 1.565
EU - Europa 802
SA - Sud America 264
AF - Africa 26
OC - Oceania 3
Continente sconosciuto - Info sul continente non disponibili 2
Totale 6.330
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Nazione #
US - Stati Uniti d'America 3.614
SG - Singapore 622
CN - Cina 496
BR - Brasile 227
UA - Ucraina 220
HK - Hong Kong 155
IT - Italia 135
DE - Germania 125
VN - Vietnam 106
TR - Turchia 103
GB - Regno Unito 98
FI - Finlandia 57
RU - Federazione Russa 47
SE - Svezia 42
MX - Messico 33
FR - Francia 27
AR - Argentina 20
IN - India 19
CA - Canada 18
PL - Polonia 18
JP - Giappone 15
ZA - Sudafrica 11
BD - Bangladesh 9
ID - Indonesia 8
UZ - Uzbekistan 7
LT - Lituania 6
BE - Belgio 5
ES - Italia 5
IQ - Iraq 5
CO - Colombia 4
EC - Ecuador 4
RS - Serbia 4
AE - Emirati Arabi Uniti 3
AT - Austria 3
IL - Israele 3
KE - Kenya 3
PE - Perù 3
PY - Paraguay 3
AU - Australia 2
BG - Bulgaria 2
DO - Repubblica Dominicana 2
DZ - Algeria 2
EE - Estonia 2
EG - Egitto 2
EU - Europa 2
KZ - Kazakistan 2
MA - Marocco 2
NL - Olanda 2
PK - Pakistan 2
TN - Tunisia 2
AM - Armenia 1
BH - Bahrain 1
CI - Costa d'Avorio 1
CL - Cile 1
CZ - Repubblica Ceca 1
ET - Etiopia 1
GM - Gambi 1
IE - Irlanda 1
JM - Giamaica 1
JO - Giordania 1
KI - Kiribati 1
KW - Kuwait 1
LU - Lussemburgo 1
MN - Mongolia 1
NP - Nepal 1
PS - Palestinian Territory 1
SA - Arabia Saudita 1
SC - Seychelles 1
SK - Slovacchia (Repubblica Slovacca) 1
TJ - Tagikistan 1
TW - Taiwan 1
UY - Uruguay 1
VE - Venezuela 1
Totale 6.330
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Città #
Woodbridge 481
Fairfield 436
Ashburn 361
Singapore 347
Houston 269
Jacksonville 222
Santa Clara 212
Beijing 185
Seattle 184
Chandler 159
Wilmington 159
Hong Kong 155
Cambridge 150
Ann Arbor 131
Izmir 85
Nanjing 79
Milan 53
Ho Chi Minh City 51
Princeton 47
Los Angeles 46
Addison 44
Boardman 38
San Diego 35
Mexico City 27
Ferrara 24
New York 24
Shanghai 23
Shenyang 22
Hanoi 21
São Paulo 18
Dallas 16
Warsaw 16
Stockholm 15
Hebei 14
Hefei 14
Helsinki 14
Nanchang 14
Tokyo 13
London 12
Bologna 11
Brooklyn 11
Denver 11
Jiaxing 11
Montreal 11
Rio de Janeiro 11
Buffalo 10
Norwalk 10
Tianjin 10
Orem 9
Atlanta 8
Chicago 8
Moscow 8
Munich 8
The Dalles 8
Redondo Beach 7
Tashkent 7
Boston 6
Changsha 6
Chennai 6
Falkenstein 6
Hangzhou 6
Jinan 6
Johannesburg 6
Mountain View 6
Ningbo 6
San Francisco 6
Brussels 5
Campinas 5
Caxias do Sul 5
Changchun 5
Goiânia 5
Guangzhou 5
Indiana 5
Redwood City 5
Salvador 5
Zhengzhou 5
Auburn Hills 4
Da Nang 4
Frankfurt am Main 4
Haiphong 4
Miami 4
New Bedfont 4
New Delhi 4
Poplar 4
Raleigh 4
Recife 4
San Mateo 4
Toronto 4
Verona 4
Belo Horizonte 3
Biên Hòa 3
Harbin 3
Jakarta 3
Joinville 3
Kunming 3
Nairobi 3
Niš 3
Nuremberg 3
Pensacola 3
Porto Alegre 3
Totale 4.570
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Nome #
A SAT Based Test Generation Method for Delay Fault Testing of Macro Based Circuits 217
Boolean and Pseudo-Boolean Test Generation for Feedback Bridging Faults 204
A fuzzy model for path delay fault detection 187
A Probabilistic Fault Model for “Analog” Faults in Digital CMOS Circuits 185
Diversity analysis in the presence of delay faults affecting duplex systems 180
A Built-In Self-Testing Framework for Asynchronous Bundled-Data NoC Switches Resilient to Delay Variations 179
Bridging fault modeling and simulation for deep submicron CMOS ICs 173
Concurrent detection of power supply noise 167
Annotated bit flip fault model 164
Exploiting Network-on-Chip Structural Redundancy for A Cooperative and Scalable Built-In Self-Test Architecture 163
"Victim gate" crosstalk fault model 161
Power efficiency of switch architecture extensions for fault tolerant NoC design 153
System-Level Infrastructure for Boot-time Testing and Configuration of Networks-on-Chip with Programmable Routing Logic 149
Bus crosstalk fault-detection capabilities of error-detecting codes for on-line testing 145
A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices 145
Signal Coding and CMOS Gates for Combinational Functional Blocks of Very Deep Submicron Self-Checking Circuits 144
Correlation between IDDQ Testing Quality and Sensor Accuracy 143
Testing Resistive Opens and Bridging Faults Through Pulse Propagation 143
Concurrent checking of clock signal correctness 135
High quality test vectors for bridging faults in the presence of IC's parameters variations 133
How many test vectors we need to detect a bridging fault? 132
Self-checking scheme for the on-line testing of power supply noise 129
Bridging Faults in Pipelined Circuits Journal of Electronic Testing, Theory and Applications 129
Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults 128
Pulse propagation for the detection of small delay defects 127
TMR voting in the presence of crosstalk faults at the voter inputs 127
Optimization of error detecting codes for the detection of crosstalk originated errors 126
Delay fault detection problems in circuits featuring a low combinational depth 123
Problems due to open faults in the interconnections of self-checking data-paths 123
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 123
Modeling and Simulation of Broken Connections in CMOS ICs 117
On-Chip Clock Faults' Detector 115
Self-checking detection and diagnosis of transient, delay, and crosstalk faults affecting bus lines 114
Efficient Resource-Aware Neural Architecture Search with a Neuro-Symbolic Approach 111
Enabling testability of fault-tolerant circuits by means of I-DDQ-checkable voters 109
Regression models for behavioral power estimation 107
Symbolic handling of bridging fault effects 99
null 99
null 94
null 92
Single Output Distribute Two-Rail Checker with Diagnosing Capabilities for Bus Based Self-Checking Architectures 91
Test pattern generation for iddq: increasing test quality 90
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits 85
null 84
A Complete Self-Testing and Self-Configuring NoC Infrastructure for Cost-Effective MPSoCs 82
An evolutionary approach to the design of on chip pseudorandom test generators 76
The challenge of classification confidence estimation in dynamically-adaptive neural networks 57
Exploring Software Models for the Resilience Analysis of Deep Learning Accelerators: the NVDLA Case Study 56
Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits 56
Online testing approach for very deep-submicron ICs 52
null 48
Fine-Grained Timing Analysis of Digital Integrated Circuits in Answer Set Programming 13
Totale 6.384
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Categoria #
all - tutte 29.552
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 29.552
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021329 0 0 0 0 0 82 11 74 11 79 47 25
2021/2022460 14 39 40 20 16 24 33 22 10 38 47 157
2022/2023439 51 0 4 49 73 66 42 46 65 1 24 18
2023/2024190 27 22 9 6 16 11 16 12 5 3 6 57
2024/2025835 12 22 91 5 98 117 45 26 79 170 107 63
2025/20261.614 246 128 275 377 450 138 0 0 0 0 0 0
Totale 6.384