Feedback bridging faults may give rise to oscillations within integrated circuits. This work mainly investigates the propagation of oscillations, a behavior that may have a relevant impact on the fault detection. We propose both a logic-level model of the faulty circuit and two techniques aiming to the generation of high-quality test sequences.

Boolean and Pseudo-Boolean Test Generation for Feedback Bridging Faults

FAVALLI, Michele;
2016

Abstract

Feedback bridging faults may give rise to oscillations within integrated circuits. This work mainly investigates the propagation of oscillations, a behavior that may have a relevant impact on the fault detection. We propose both a logic-level model of the faulty circuit and two techniques aiming to the generation of high-quality test sequences.
2016
Favalli, Michele; Dalpasso, Marcello
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2341290
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