A Built-In Self-Testing Framework for Asynchronous Bundled-Data NoC Switches Resilient to Delay Variations

Most multi- and many-core integrated systems are currently designed by following a globally asynchronous locally synchronous paradigm. Asynchronous interconnection networks are promising candidates to interconnect IP cores operating at potentially different frequencies. Nevertheless, post-fabrication testing is a big challenge to bring asynchronous NoCs to the market due to a lack of testing methodologies and support for them. In particular, the unpredictable delay variability introduced by the manufacturing process may differentiate the delay of nominally-balanced I/O timing paths, thus making the order of the input patterns unpredictable and precluding the correct behaviour of signature-based test compactors. This paper tackles this challenge by proposing a testing framework for asynchronous NoCs which works effectively despite delay variations in and across timing paths of the NoC under test. Moreover, in order to mitigate the growing test application costs in modern ICs, we come up with a built-in self-testing infrastructure which automatically controls and delivers the outcome of the testing process without the intervention of an external automatic test equipment (ATE).