In this paper we investigate the complexity of the characterization of electron devices with microwave load-pull systems when harmonically-tuned classes of amplification are adopted. In particular, we highlight the effects of the transistor dynamic nonlinearities on the load impedances at the transistor current-generator plane.
Load-Pull Measurements Oriented to Harmonically-Tuned Power Amplifier Design
Bosi, GianniPrimo
;Raffo, Antonio
Secondo
;Vadalà, Valeria;Vannini, Giorgio;Colantonio, Paolo;Limiti, Ernesto
2020
Abstract
In this paper we investigate the complexity of the characterization of electron devices with microwave load-pull systems when harmonically-tuned classes of amplification are adopted. In particular, we highlight the effects of the transistor dynamic nonlinearities on the load impedances at the transistor current-generator plane.File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
10.1109@INMMiC46721.2020.9160151.pdf
solo gestori archivio
Descrizione: versione editoriale
Tipologia:
Full text (versione editoriale)
Licenza:
NON PUBBLICO - Accesso privato/ristretto
Dimensione
836.64 kB
Formato
Adobe PDF
|
836.64 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in SFERA sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
