NALLI, ANDREA
 Distribuzione geografica
Continente #
NA - Nord America 890
EU - Europa 377
AS - Asia 158
AF - Africa 2
OC - Oceania 1
SA - Sud America 1
Totale 1.429
Nazione #
US - Stati Uniti d'America 888
PL - Polonia 150
CN - Cina 84
IT - Italia 77
UA - Ucraina 45
TR - Turchia 41
DE - Germania 30
SE - Svezia 29
SG - Singapore 26
GB - Regno Unito 25
FI - Finlandia 12
FR - Francia 4
ID - Indonesia 4
CA - Canada 2
LT - Lituania 2
MA - Marocco 2
VN - Vietnam 2
AU - Australia 1
BE - Belgio 1
BG - Bulgaria 1
BR - Brasile 1
ES - Italia 1
KR - Corea 1
Totale 1.429
Città #
Warsaw 150
Fairfield 126
Houston 100
Woodbridge 96
Ashburn 83
Ann Arbor 58
Jacksonville 58
Seattle 56
Wilmington 47
Chandler 44
Ferrara 44
Cambridge 43
Beijing 36
Santa Clara 27
Nanjing 22
Singapore 20
Izmir 14
Milan 13
Princeton 13
San Diego 11
Boardman 9
Addison 5
Los Angeles 5
Washington 5
Cagliari 4
Jakarta 4
Kunming 4
Munich 4
Nanchang 4
Shanghai 4
Hebei 3
London 3
Shenyang 3
Tianjin 3
Changsha 2
Dearborn 2
Dong Ket 2
Indiana 2
Mountain View 2
Norwalk 2
Paris 2
Parma 2
Settimo Milanese 2
Toronto 2
Vancouver 2
Brussels 1
Chicago 1
Council Bluffs 1
Daejeon 1
Des Moines 1
Frankfurt am Main 1
Freiburg 1
Haikou 1
Jiaxing 1
Leipzig 1
Mataró 1
Melbourne 1
Newcastle upon Tyne 1
Orange 1
Pisa 1
Redmond 1
Redwood City 1
Sao Jose do Mantimento 1
Trieste 1
Walnut 1
Yellow Springs 1
Zhengzhou 1
Totale 1.165
Nome #
CHARACTERIZATION AND MODELING OF III-V TRANSISTORS FOR MICROWAVE CIRCUIT DESIGN 194
GaN HEMT Noise Model Based on Electromagnetic Simulations 176
Extremely Low-Frequency Measurements Using an Active Bias Tee 132
GaN HEMT noise modeling based on 50-Ω noise factor 129
Linear versus nonlinear de-embedding: Experimental investigation 115
Identification of the optimum operation for GaN HEMTs in high-power amplifiers 110
GaN Ku-band low-noise amplifier design including RF life test 109
Evaluation of FET performance and restrictions by low-frequency measurements 107
Characterization of charge-trapping effects in GaN FETs through low-frequency measurements 104
null 92
null 63
null 55
A Load–Pull Characterization Technique Accounting for Harmonic Tuning 26
GaN HEMT Modelling Through 50-Ω NF Measurements 20
A scalable HEMT noise model based on FW-EM analyses 19
Totale 1.451
Categoria #
all - tutte 5.783
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.783


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020207 0 0 0 0 0 36 30 30 30 31 40 10
2020/2021236 21 15 12 21 12 22 19 25 9 50 18 12
2021/2022144 10 8 12 4 17 7 5 7 5 7 20 42
2022/2023116 12 1 3 9 18 23 15 9 17 0 6 3
2023/202476 8 6 6 4 17 8 3 5 3 0 3 13
2024/202575 5 3 26 6 35 0 0 0 0 0 0 0
Totale 1.451