In this paper a new methodology to characterize the breakdown of microwave electron devices under realistic device operation is described. Different experimental examples will be provided in order to demonstrate the validity of the proposed characterization technique with respect to the ones commonly adopted.

Characterization of Electron Device Breakdown Under Nonlinear Dynamic Operation

RAFFO, Antonio;DI FALCO, Sergio;VADALA', Valeria;VANNINI, Giorgio
2010

Abstract

In this paper a new methodology to characterize the breakdown of microwave electron devices under realistic device operation is described. Different experimental examples will be provided in order to demonstrate the validity of the proposed characterization technique with respect to the ones commonly adopted.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/1503313
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