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EnglishWe present an analysis of the propagation of measurement uncertainty in microwave transistor nonlinear models. As a case study, we focus on residual calibration uncertainty and its effect on modeled nonlinear capacitances extracted from small-signal microwave measurements. We evaluate the uncertainty by means of the polynomial chaos expansion (PCE) method and compare the results with the NIST Microwave Uncertainty Framework, which enables both sensitivity and Monte Carlo (MC) analyses for uncertainty quantification in microwave measurements. We demonstrate that, for the considered application, PCE provides results in agreement with classical MC simulations but with a significant reduction of the computational effort.
| Data di pubblicazione: | 2017 | |
| Titolo: | Measurement Uncertainty Propagation in Transistor Model Parameters via Polynomial Chaos Expansion | |
| Autori: | Petrocchi, Alessandra; Kaintura, Arun; Avolio, Gustavo; Spina, Domenico; Dhaene, Tom; Raffo, Antonio; Schreurs, Dominique M. M. P. | |
| Rivista: | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | |
| Keywords: | Field-effect transistor, Microwave measurements uncertainty, Nonlinear modeling | |
| Abstract in inglese: | We present an analysis of the propagation of measurement uncertainty in microwave transistor nonlinear models. As a case study, we focus on residual calibration uncertainty and its effect on modeled nonlinear capacitances extracted from small-signal microwave measurements. We evaluate the uncertainty by means of the polynomial chaos expansion (PCE) method and compare the results with the NIST Microwave Uncertainty Framework, which enables both sensitivity and Monte Carlo (MC) analyses for uncertainty quantification in microwave measurements. We demonstrate that, for the considered application, PCE provides results in agreement with classical MC simulations but with a significant reduction of the computational effort. | |
| Digital Object Identifier (DOI): | 10.1109/LMWC.2017.2701334 | |
| Handle: | http://hdl.handle.net/11392/2371772 | |
| Appare nelle tipologie: | 03.1 Articolo su rivista |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| measurement uncertainty propagation in transistor model parameters via polynomial chaos expansion.POSTPRINT.pdf | Post print | Post-print | PUBBLICO - Pubblico con Copyright | Open Access Visualizza/Apri |
| 11392_2371772_FULL_Raffo.pdf | Full text editoriale | Full text (versione editoriale) | NON PUBBLICO - Accesso privato/ristretto | Administrator Richiedi una copia |
http://hdl.handle.net/11392/2371772
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