The purpose of this letter is to present an experimental analysis of the temperature effects on the small-signal equivalent circuit of a GaN HEMT. With the aim of contributing to the exploration and advancement of this technology for high-power and high-temperature applications, the major intrinsic RF figures of merit together with the positive derivative of the real parts of the impedance parameters versus frequency are deeply investigated versus ambient temperature.

Temperature Influence on GaN HEMT Equivalent Circuit

RAFFO, Antonio
Secondo
;
VANNINI, Giorgio
Penultimo
;
2016

Abstract

The purpose of this letter is to present an experimental analysis of the temperature effects on the small-signal equivalent circuit of a GaN HEMT. With the aim of contributing to the exploration and advancement of this technology for high-power and high-temperature applications, the major intrinsic RF figures of merit together with the positive derivative of the real parts of the impedance parameters versus frequency are deeply investigated versus ambient temperature.
2016
Crupi, Giovanni; Raffo, Antonio; Avolio, Gustavo; Schreurs, Dominique M. M. P.; Vannini, Giorgio; Caddemi, Alina
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2353952
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