This letter provides a clear understanding of the kink effect in S22 for active solid-state electronic devices. The origin of the kink effect is ascribed to the intrinsic section of the transistor, whereas the extrinsic elements determine its shape at the extrinsic ports. Therefore, to fairly compare the kink effect for GaN and GaAs HEMTs, the present analysis is not only focused on the whole devices but also on their intrinsic sections. The experimental evidence shows that, independently of the specific semiconductor technology, the size and the frequency band of the kink effect are mainly due to the values of the intrinsic transconductance and capacitances, respectively.

Kink Effect in S22 for GaN and GaAs HEMTs

RAFFO, Antonio
Secondo
;
VANNINI, Giorgio
Ultimo
2015

Abstract

This letter provides a clear understanding of the kink effect in S22 for active solid-state electronic devices. The origin of the kink effect is ascribed to the intrinsic section of the transistor, whereas the extrinsic elements determine its shape at the extrinsic ports. Therefore, to fairly compare the kink effect for GaN and GaAs HEMTs, the present analysis is not only focused on the whole devices but also on their intrinsic sections. The experimental evidence shows that, independently of the specific semiconductor technology, the size and the frequency band of the kink effect are mainly due to the values of the intrinsic transconductance and capacitances, respectively.
2015
Crupi, Giovanni; Raffo, Antonio; Caddemi, Alina; Vannini, Giorgio
File in questo prodotto:
File Dimensione Formato  
Microsoft Word - MWCL-14-0915__Manuscript_POST.pdf

accesso aperto

Tipologia: Post-print
Licenza: PUBBLICO - Pubblico con Copyright
Dimensione 334.36 kB
Formato Adobe PDF
334.36 kB Adobe PDF Visualizza/Apri
11392_2332503_FULL_Vannini.pdf

solo gestori archivio

Tipologia: Full text (versione editoriale)
Licenza: NON PUBBLICO - Accesso privato/ristretto
Dimensione 485.81 kB
Formato Adobe PDF
485.81 kB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in SFERA sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2332503
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 35
  • ???jsp.display-item.citation.isi??? 31
social impact