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EnglishDiffuse reflectance spectroscopy in the UV-vis-NIR is employed to study the electronic transitions in MoO3-WO3 mixed oxide. The spectroscopic results were then related to the temp. profile of the surface barrier. The electronic absorptions appear to increase after reducing treatments and to decrease after oxidn. This variation of oxygen-related defects changes the doping level, which in turn, affects the dependence of surface barrier on temp. The latter is strictly connected to the sensing properties of the mixed oxide.
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| Titolo: | Surface barrier modulation and diffuse reflectance spectroscopy of MoO3-WO3 thick films | |
| Autori: | ||
| Data di pubblicazione: | 2006 | |
| Rivista: | ||
| Abstract: | Diffuse reflectance spectroscopy in the UV-vis-NIR is employed to study the electronic transitions in MoO3-WO3 mixed oxide. The spectroscopic results were then related to the temp. profile of the surface barrier. The electronic absorptions appear to increase after reducing treatments and to decrease after oxidn. This variation of oxygen-related defects changes the doping level, which in turn, affects the dependence of surface barrier on temp. The latter is strictly connected to the sensing properties of the mixed oxide. | |
| Handle: | http://hdl.handle.net/11392/522833 | |
| Appare nelle tipologie: | 03.1 Articolo su rivista |
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