Editor’s notes: This article investigates cross-temperature effects in 3-D NAND flash and demonstrates mitigation through adaptive read-reference schemes with system-level analysis.
Addressing the Cross-Temperature Issue in 3-D NAND Flash Memories: Characterization and Mitigation for Solid-State Drives
Zambelli, Cristian
;Micheloni, Rino
2026
Abstract
Editor’s notes: This article investigates cross-temperature effects in 3-D NAND flash and demonstrates mitigation through adaptive read-reference schemes with system-level analysis.File in questo prodotto:
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