The dependence of the interlayer coupling on both the soft (FeTaN) and hard (FeSm) layer thickness in FeTaN-FeSm-FeTaN multilayers, deposited by dc magnetron sputtering, has been investigated. The magnetization reversal process is examined experimentally using a magnetooptical Kerr effect. The exchange field Hex, which is a measure of the average coupling between the soft and hard layers, was determined from the field shift of the minor hysteresis loop. The value of Hex increases as the number of the soft FeTaN layer increases. A significant and fully reversible transverse hysteresis loop was measured indicating that, during the magnetization-reversal process, the magnetic moments in the soft layers rotate reversibly, as typical of exchange-spring systems.

Exchange Coupling in FeTaN-FeSm-FeTaN Multilayers: A Kerr Effect Study

VAVASSORI, Paolo;
2002

Abstract

The dependence of the interlayer coupling on both the soft (FeTaN) and hard (FeSm) layer thickness in FeTaN-FeSm-FeTaN multilayers, deposited by dc magnetron sputtering, has been investigated. The magnetization reversal process is examined experimentally using a magnetooptical Kerr effect. The exchange field Hex, which is a measure of the average coupling between the soft and hard layers, was determined from the field shift of the minor hysteresis loop. The value of Hex increases as the number of the soft FeTaN layer increases. A significant and fully reversible transverse hysteresis loop was measured indicating that, during the magnetization-reversal process, the magnetic moments in the soft layers rotate reversibly, as typical of exchange-spring systems.
2002
G., Gubbiotti; G., Carlotti; M., Madami; J., Weston; Vavassori, Paolo; G., Zangari
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/1211051
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