CINECA IRIS Institutional Research Information System
IRIS è la soluzione IT che facilita la raccolta e la gestione dei dati relativi alle attività e ai prodotti della ricerca. Fornisce a ricercatori, amministratori e valutatori gli strumenti per monitorare i risultati della ricerca, aumentarne la visibilità e allocare in modo efficace le risorse disponibili.
EnglishA new approach is proposed which takes into account both traps and thermal phenomena for the modelling of deviations between static and dynamic drain current characteristics in III-V field effect transistors. The model is based on the well-known ‘backgating’ concept and can easily be identified on the basis of conventional static drain current characteristics and small-signal, low-frequency S parameters. Experimental results confirm the accuracy of the proposed model.
| Data di pubblicazione: | 1999 | |
| Titolo: | Backgating model including self-heating for low-frequency dispersive effect in III-V FETs | |
| Autori: | A., Santarelli; F., Filiocori; Vannini, G.; P., Rinaldi | |
| Rivista: | ELECTRONICS LETTERS | |
| Keywords: | Dispersive Effects; Electron Devices; Non-linear Model; Microwaves | |
| Abstract in inglese: | A new approach is proposed which takes into account both traps and thermal phenomena for the modelling of deviations between static and dynamic drain current characteristics in III-V field effect transistors. The model is based on the well-known ‘backgating’ concept and can easily be identified on the basis of conventional static drain current characteristics and small-signal, low-frequency S parameters. Experimental results confirm the accuracy of the proposed model. | |
| Digital Object Identifier (DOI): | 10.1049/el:19981351 | |
| Handle: | http://hdl.handle.net/11392/1210709 | |
| Appare nelle tipologie: | 03.1 Articolo su rivista |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| 00722063.pdf | versione editoriale | Full text (versione editoriale) | NON PUBBLICO - Accesso privato/ristretto | Administrator Richiedi una copia |
| 00722063.pdf | Full text editoriale | Full text (versione editoriale) | PUBBLICO - Pubblico con Copyright | Open Access Visualizza/Apri |
http://hdl.handle.net/11392/1210709
Copyright © 2022