Nonlinear Integral Models (Finite Memory Models) including Modeling of dispersive effects and related Experimental results will be presented. The activity is related to the Quickshot WP developed in the framework of the TARGET NoE, VI FWP
Integral approaches to electron device modeling taking into account low frequency dispersion effects
VANNINI, Giorgio;
2005
Abstract
Nonlinear Integral Models (Finite Memory Models) including Modeling of dispersive effects and related Experimental results will be presented. The activity is related to the Quickshot WP developed in the framework of the TARGET NoE, VI FWPFile in questo prodotto:
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