In this paper we investigate the complexity of the characterization of electron devices with microwave load-pull systems when harmonically-tuned classes of amplification are adopted. In particular, we highlight the effects of the transistor dynamic nonlinearities on the load impedances at the transistor current-generator plane.

Load-Pull Measurements Oriented to Harmonically-Tuned Power Amplifier Design

Bosi, Gianni
Primo
;
Raffo, Antonio
Secondo
;
Vadalà, Valeria;Vannini, Giorgio;Colantonio, Paolo;Limiti, Ernesto
2020

Abstract

In this paper we investigate the complexity of the characterization of electron devices with microwave load-pull systems when harmonically-tuned classes of amplification are adopted. In particular, we highlight the effects of the transistor dynamic nonlinearities on the load impedances at the transistor current-generator plane.
2020
9781728126456
load pull measurements, power amplifiers, semiconductor device measurements
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2422313
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