Radiation hardness tests of the CLARO8 ASIC, designed in AMS 0.35micron CMOS technology for the upgrade of the CERN LHCb RICH detectors, are presented, including measurements of total-ionizing dose and single event effects.
Radiation Hardness of the CLARO8 ASIC: a Fast Single-Photon Counting Chip for the LHCb Experiment at CERN
ANDREOTTI, Mirco;CALABRESE, Roberto;FIORINI, Massimiliano;LUPPI, Eleonora;MINZONI, Luca;PAPPALARDO, Luciano Libero;TOMASSETTI, Luca
2016
Abstract
Radiation hardness tests of the CLARO8 ASIC, designed in AMS 0.35micron CMOS technology for the upgrade of the CERN LHCb RICH detectors, are presented, including measurements of total-ionizing dose and single event effects.File in questo prodotto:
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