We analyze the uncertainty contribution of the Nonlinear-Embedding design technique in transposing the low-frequency data to microwave frequencies. Uncertainty analysis is performed with the NIST Microwave Uncertainty Framework and is applied to a GaAs pHEMT device.

Impact of microwave measurement uncertainty on the Nonlinear Embedding procedure

BOSI, Gianni;RAFFO, Antonio;
2016

Abstract

We analyze the uncertainty contribution of the Nonlinear-Embedding design technique in transposing the low-frequency data to microwave frequencies. Uncertainty analysis is performed with the NIST Microwave Uncertainty Framework and is applied to a GaAs pHEMT device.
2016
9781509013081
9781509013081
Microwave measurements uncertainty; microwave transistors; nonlinear embedding; power amplifiers; vector-calibrated nonlinear measurements; Computer Networks and Communications; Instrumentation;
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2353332
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