The over-erase algorithm is the state of the art procedure exploited in NOR Flash architectures to increase the memory reliability against the over-erase phenomenon mainly caused by either fast or erratic bits. In FN/FN architectures, since the soft-programming operation involved in the algorithm uses the same physical mechanism of the erase operation, its execution potentially triggers additional failures. In this paper, a detailed characterization of the soft-programming failures is provided by categorizing their statistical occurrence in order to capture their relationship with the failures exposed after the execution of the algorithm. A model of the failure rate is then derived to provide a rough guideline for over-erase algorithm optimization in terms of performance and reliability.

Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays

ZAMBELLI, Cristian
Primo
;
OLIVO, Piero
Ultimo
2015

Abstract

The over-erase algorithm is the state of the art procedure exploited in NOR Flash architectures to increase the memory reliability against the over-erase phenomenon mainly caused by either fast or erratic bits. In FN/FN architectures, since the soft-programming operation involved in the algorithm uses the same physical mechanism of the erase operation, its execution potentially triggers additional failures. In this paper, a detailed characterization of the soft-programming failures is provided by categorizing their statistical occurrence in order to capture their relationship with the failures exposed after the execution of the algorithm. A model of the failure rate is then derived to provide a rough guideline for over-erase algorithm optimization in terms of performance and reliability.
2015
Zambelli, Cristian; Olivo, Piero
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2338671
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