We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National Institute of Standards and Technology (NIST) Microwave Uncertainty Framework. We include in our analysis uncertainties in the passive calibration standards, power meter, NIST-traceable phase calibration reference, cable bending, and probe alignment. These uncertainties are propagated first to the electrical quantities across the terminals of the device-under-test, which was an on-wafer microwave transistor. Next, we propagate uncertainties to the transistor current-generator plane, whose temporal voltage/current waveforms and impedances are of interest for the design of power amplifiers.

Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors

RAFFO, Antonio
Secondo
;
2015

Abstract

We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National Institute of Standards and Technology (NIST) Microwave Uncertainty Framework. We include in our analysis uncertainties in the passive calibration standards, power meter, NIST-traceable phase calibration reference, cable bending, and probe alignment. These uncertainties are propagated first to the electrical quantities across the terminals of the device-under-test, which was an on-wafer microwave transistor. Next, we propagate uncertainties to the transistor current-generator plane, whose temporal voltage/current waveforms and impedances are of interest for the design of power amplifiers.
2015
Avolio, Gustavo; Raffo, Antonio; Jargon, Jeffrey; Hale, Paul D.; Schreurs, Dominique M. M. P.; Williams, Dylan F.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2332479
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