The diffraction capability of two crystalline silicon plates bent by carbon fiber deposition has been studied. The performed treatment induced a permanent curvature in the samples, resulting in an increase of the diffraction efficiency. The obtained efficiencies are constant over a wide angular range and close to the theoretical expectations, meaning that the curvatures were homogeneous. Most importantly, the bending technique allowed the manufacture of bent samples up to 5 mm thick and with a radius of curvature down to 30 m. With such a technique, the fabrication of crystals for the realization of a hard X-ray concentrator (Laue lens) for astrophysical purposes is enabled.

High diffraction efficiency with hard X-rays through a thick silicon crystal bent by carbon fiber deposition

CAMATTARI, Riccardo;BELLUCCI, Valerio;MAZZOLARI, Andrea;GUIDI, Vincenzo
2014

Abstract

The diffraction capability of two crystalline silicon plates bent by carbon fiber deposition has been studied. The performed treatment induced a permanent curvature in the samples, resulting in an increase of the diffraction efficiency. The obtained efficiencies are constant over a wide angular range and close to the theoretical expectations, meaning that the curvatures were homogeneous. Most importantly, the bending technique allowed the manufacture of bent samples up to 5 mm thick and with a radius of curvature down to 30 m. With such a technique, the fabrication of crystals for the realization of a hard X-ray concentrator (Laue lens) for astrophysical purposes is enabled.
2014
Camattari, Riccardo; Enrico, Dolcini; Bellucci, Valerio; Mazzolari, Andrea; Guidi, Vincenzo
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2135812
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