In this work a SET/RESET investigation in cycling on ReRAM arrays has been performed, in order to find the most reliable SET/RESET operation conditions. The analysis will compare DC and pulsed SET/RESET operations featuring different durations and voltages on previously DC formed 1T-1R 4kbits memory arrays. A thorough analysis of the ReRAM reliability joining the cell-to-cell variability analysis to that of cycling evaluations in complete arrays is addressed. A comparison between DC and Pulse SET/RESET in terms of switching yield, read window, device-to-device uniformity and bit error rate is reported. Finally, the impact of a temperature bake at 125C on a cycled array is shown to study the temperature impact on the array variability.

Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions

ZAMBELLI, Cristian;GROSSI, Alessandro;OLIVO, Piero;
2014

Abstract

In this work a SET/RESET investigation in cycling on ReRAM arrays has been performed, in order to find the most reliable SET/RESET operation conditions. The analysis will compare DC and pulsed SET/RESET operations featuring different durations and voltages on previously DC formed 1T-1R 4kbits memory arrays. A thorough analysis of the ReRAM reliability joining the cell-to-cell variability analysis to that of cycling evaluations in complete arrays is addressed. A comparison between DC and Pulse SET/RESET in terms of switching yield, read window, device-to-device uniformity and bit error rate is reported. Finally, the impact of a temperature bake at 125C on a cycled array is shown to study the temperature impact on the array variability.
2014
9781479935963
Non-Volatile Memory; RRAM
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in SFERA sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/2023612
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 18
  • ???jsp.display-item.citation.isi??? 11
social impact