The erratic bits phenomenon in non-volatile memories (NVM) has been evidenced in several technologies as a main reliability detractor. Usually this issue is handled by repair strategies which spans from static redundancy to dynamic correction codes. This evidences a trade-off in reliability/performance domain that is due to the limitation in the repair resources amount and correction strength. In this work we expose this trade-off in different NVM technologies such as embedded NOR Flash and Phase Change Memories through an accurate EB testing, signature classification procedure, and Chip Failure Rate estimation.

Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification

ZAMBELLI, Cristian;OLIVO, Piero
2014

Abstract

The erratic bits phenomenon in non-volatile memories (NVM) has been evidenced in several technologies as a main reliability detractor. Usually this issue is handled by repair strategies which spans from static redundancy to dynamic correction codes. This evidences a trade-off in reliability/performance domain that is due to the limitation in the repair resources amount and correction strength. In this work we expose this trade-off in different NVM technologies such as embedded NOR Flash and Phase Change Memories through an accurate EB testing, signature classification procedure, and Chip Failure Rate estimation.
2014
Zambelli, Cristian; G., Koebernik; R., Ullmann; M., Bauer; G., Tempel; F., Di Tano; M., Atti; F. P., Pistone; A., Siviero; Olivo, Piero
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in SFERA sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/1902011
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 2
  • ???jsp.display-item.citation.isi??? 2
social impact