Large-signal modelling of electron devices for nonlinear MMIC design is a fundamental topic for the microwave community. Many different non-linear modelling approaches have been proposed in the last years, and quite often circuit designers suffer from the lack of reliable comparison criteria to identify which model (between those available) could be the most suitable for the desired application. Moreover, similar strategies are needed even from the research groups, whose activity is devoted to the model identification and extraction, in order to quantify the degree of accuracy achievable by the modelling approach adopted. In this paper an approach to verify large-signal model accuracy will be discussed, which is simply based on the comparison between de-embedded measurements and model predictions of Y-parameters versus the bias voltages at the intrinsic device ports.

Simplified Validation of Non-Linear Models for Micro- and Millimeter-Wave Electron Devices

RAFFO, Antonio;VANNINI, Giorgio;
2005

Abstract

Large-signal modelling of electron devices for nonlinear MMIC design is a fundamental topic for the microwave community. Many different non-linear modelling approaches have been proposed in the last years, and quite often circuit designers suffer from the lack of reliable comparison criteria to identify which model (between those available) could be the most suitable for the desired application. Moreover, similar strategies are needed even from the research groups, whose activity is devoted to the model identification and extraction, in order to quantify the degree of accuracy achievable by the modelling approach adopted. In this paper an approach to verify large-signal model accuracy will be discussed, which is simply based on the comparison between de-embedded measurements and model predictions of Y-parameters versus the bias voltages at the intrinsic device ports.
2005
9782960055108
MIMIC; MMIC; integrated circuit design; integrated circuit modelling
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in SFERA sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/1196415
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? 0
social impact