A new BIST scheme suitable for on-chip testing of non-volatile memories and based on signature analysis is presented. The signature of the whole memory, whose content can be selectively changed by the user, is dynamically self-learned by the memory and it is saved in a dedicated memory location. Such a signature can be externally compared with the expected one in order to check for the programming operation, or it can be used for self-test when data retention must be checked
Self-Learning Signature analysis for non-volatile memory testing
OLIVO, Piero;
1996
Abstract
A new BIST scheme suitable for on-chip testing of non-volatile memories and based on signature analysis is presented. The signature of the whole memory, whose content can be selectively changed by the user, is dynamically self-learned by the memory and it is saved in a dedicated memory location. Such a signature can be externally compared with the expected one in order to check for the programming operation, or it can be used for self-test when data retention must be checkedFile in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in SFERA sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
